Sudou; Satoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sudou; Satoshi.The latest application filed is for "consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus".

Company Profile

0.7.6

Sudou; Satoshi - Tokyo JP
Sudou, Satoshi - Naoyoshi Watanabe JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Variable delay circuit, testing apparatus, and electronic device Grant 7,755,407 - Hasumi , et al. July 13, 2	2010-07-13
Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus Grant 7,558,692 - Suda , et al. July 7, 2	2009-07-07
Multi-strobe apparatus, testing apparatus, and adjusting method Grant 7,406,646 - Sato , et al. July 29, 2	2008-07-29
Consumption Current Balance Circuit, Compensation Current Amount Adjusting Method, Timing Generator, and Semiconductor Testing Apparatus App 20080116901 - Suda; Masakatsu ; et al.	2008-05-22
Variable delay circuit App 20060170472 - Suda; Masakatsu ; et al.	2006-08-03
Variable delay circuit Grant 7,071,746 - Suda , et al. July 4, 2	2006-07-04
Timing comparator, data sampling apparatus, and testing apparatus Grant 7,034,723 - Suda , et al. April 25, 2	2006-04-25
Clock recovery circuit and communication device Grant 6,987,410 - Suda , et al. January 17, 2	2006-01-17
Semiconductor device tester Grant 6,903,566 - Sudou , et al. June 7, 2	2005-06-07
Clock recovery circuit and communication device App 20050110544 - Suda, Masakatsu ; et al.	2005-05-26
Variable delay circuit App 20050110548 - Suda, Masakatsu ; et al.	2005-05-26
Timing comparator, data sampling apparatus, and testing apparatus App 20050111602 - Suda, Masakatsu ; et al.	2005-05-26
Semiconductor device tester App 20040251924 - Sudou, Satoshi	2004-12-16

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