Suda; Masakatsu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Suda; Masakatsu.The latest application filed is for "authentication system, authentication method and service providing system".

Company Profile

0.43.41

Suda; Masakatsu - Saitama JP
Suda; Masakatsu - Tokyo N/A JP
Suda; Masakatsu - Nerima-ku Tokyo
Suda; Masakatsu - Kitamoto JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Authentication terminal Grant 9,871,788 - Degawa , et al. January 16, 2	2018-01-16
Authentication system, authentication method and service providing system Grant 9,871,789 - Degawa , et al. January 16, 2	2018-01-16
Authentication Terminal App 20160127361 - DEGAWA; Katsuhiko ; et al.	2016-05-05
Authentication System, Authentication Method And Service Providing System App 20160127362 - DEGAWA; Katsuhiko ; et al.	2016-05-05
Semiconductor circuit with load balance circuit Grant 8,555,098 - Fujibe , et al. October 8, 2	2013-10-08
Clock hand-off circuit Grant 8,451,034 - Fujibe , et al. May 28, 2	2013-05-28
Timing generator and test apparatus Grant 8,441,296 - Suda May 14, 2	2013-05-14
Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium Grant 8,375,340 - Watanabe , et al. February 12, 2	2013-02-12
Signal generation and detection apparatus and tester Grant 8,330,471 - Suda December 11, 2	2012-12-11
Timing Generator And Test Apparatus App 20120262215 - Suda; Masakatsu	2012-10-18
Loop type clock adjustment circuit and test device Grant 8,198,926 - Fujita , et al. June 12, 2	2012-06-12
Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method Grant 8,058,891 - Hasumi , et al. November 15, 2	2011-11-15
Test Apparatus, Measurement Apparatus, And Electronic Device App 20110231128 - SUDA; Masakatsu ; et al.	2011-09-22
Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method Grant 7,987,062 - Fujita , et al. July 26, 2	2011-07-26
Test apparatus, test method and computer readable medium Grant 7,979,218 - Suda July 12, 2	2011-07-12
Variable delay circuit, timing generator and semiconductor testing apparatus Grant 7,960,996 - Suda June 14, 2	2011-06-14
Clock Hand-off Circuit App 20110128052 - Fujibe; Tasuku ; et al.	2011-06-02
Apparatus For Manufacturing Substrate For Testing, Method For Manufacturing Substrate For Testing And Recording Medium App 20110125308 - WATANABE; Daisuke ; et al.	2011-05-26
Timing generator and semiconductor test apparatus Grant 7,944,263 - Suda May 17, 2	2011-05-17
Semiconductor Integrated Circuit App 20110109377 - Fujibe; Tasuku ; et al.	2011-05-12
Timing generator and semiconductor test apparatus Grant 7,940,072 - Suda May 10, 2	2011-05-10
Loop Type Clock Adjustment Circuit And Test Device App 20110089983 - Fujita; Kazuhiro ; et al.	2011-04-21
Test device, test method and computer readable media Grant 7,908,110 - Suda March 15, 2	2011-03-15
Oscillation circuit, test apparatus and electronic device Grant 7,863,990 - Suda January 4, 2	2011-01-04
Vernier delay circuit Grant 7,830,191 - Kojima , et al. November 9, 2	2010-11-09
Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction method Grant 7,800,390 - Suda September 21, 2	2010-09-21
Electronic device, load fluctuation compensation circuit, power supply, and test apparatus Grant 7,782,075 - Suda August 24, 2	2010-08-24
Variable delay circuit, testing apparatus, and electronic device Grant 7,755,407 - Hasumi , et al. July 13, 2	2010-07-13
Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit Grant 7,714,600 - Hasumi , et al. May 11, 2	2010-05-11
Test apparatus and test method Grant 7,696,771 - Tanaka , et al. April 13, 2	2010-04-13
Timing generator and semiconductor test apparatus App 20100060294 - Suda; Masakatsu	2010-03-11
Load Fluctuation Correction Circuit, Electronic Device, Testing Device, And Load Fluctuation Correction Method App 20100039078 - SUDA; Masakatsu	2010-02-18
Timing generator and semiconductor testing apparatus Grant 7,665,004 - Suda , et al. February 16, 2	2010-02-16
Variable Delay Circuit, Timing Generator And Semiconductor Testing Apparatus App 20100019795 - Suda; Masakatsu	2010-01-28
Test Apparatus, Test Method And Computer Readable Medium App 20090287431 - Suda; Masakatsu	2009-11-19
Vernier Delay Circuit App 20090273384 - Kojima; Shoji ; et al.	2009-11-05
Signal Output Device, Signal Detection Device, Tester, Electron Device, And Program App 20090265597 - SUDA; MASAKATSU	2009-10-22
Delay Lock Loop Circuit, Timing Generator, Semiconductor Test Device, Semiconductor Integrated Circuit, and Delay Amount Calibration Method App 20090256577 - Hasumi; Takuya ; et al.	2009-10-15
Timing generator and semiconductor test apparatus App 20090230946 - Suda; Masakatsu	2009-09-17
Test Device, Test Method And Computer Readable Media App 20090228227 - SUDA; MASAKATSU	2009-09-10
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device Grant 7,574,316 - Suda , et al. August 11, 2	2009-08-11
Delay lock loop circuit, phase lock loop circuit, timing generator, semiconductor tester and semiconductor integrated circuit App 20090184741 - Suda; Masakatsu ; et al.	2009-07-23
Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus Grant 7,558,692 - Suda , et al. July 7, 2	2009-07-07
Electronic Device, Load Fluctuation Compensation Circuit, Power Supply, And Test Apparatus App 20090160536 - SUDA; MASAKATSU	2009-06-25
Oscillation Circuit, Test Apparatus And Electronic Device App 20090146703 - SUDA; MASAKATSU	2009-06-11
Timing Generator And Semiconductor Testing Apparatus App 20090132884 - Suda; Masakatsu ; et al.	2009-05-21
Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit Grant 7,535,273 - Suda May 19, 2	2009-05-19
Delay circuit, and testing apparatus Grant 7,511,547 - Suda , et al. March 31, 2	2009-03-31
Test Apparatus And Test Method App 20090058452 - TANAKA; KOICHI ; et al.	2009-03-05
Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit Grant 7,492,198 - Suda February 17, 2	2009-02-17
Variable Delay Circuit, Testing Apparatus, And Electronic Device App 20090039939 - HASUMI; TAKUYA ; et al.	2009-02-12
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device Grant 7,460,969 - Suda , et al. December 2, 2	2008-12-02
Delay circuit and test apparatus App 20080258714 - Suda; Masakatsu ; et al.	2008-10-23
Pulse Width Adjustment Circuit, Pulse Width Adjustment Method, And Test Apparatus For Semiconductor Device App 20080201099 - Suda; Masakatsu ; et al.	2008-08-21
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device Grant 7,398,169 - Yamaguchi , et al. July 8, 2	2008-07-08
Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit App 20080143399 - Suda; Masakatsu	2008-06-19
Delay circuit and test apparatus using delay element and buffer Grant 7,382,117 - Suda , et al. June 3, 2	2008-06-03
Consumption Current Balance Circuit, Compensation Current Amount Adjusting Method, Timing Generator, and Semiconductor Testing Apparatus App 20080116901 - Suda; Masakatsu ; et al.	2008-05-22
Delay Circuit, Test Apparatus, Storage Medium Semiconductor Chip, Initializing Circuit And Initializing Method App 20080048750 - Fujita; Kazuhiro ; et al.	2008-02-28
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device App 20080018371 - Suda; Masakatsu ; et al.	2008-01-24
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device App 20070203659 - Yamaguchi; Takahiro ; et al.	2007-08-30
Delay circuit and test apparatus App 20060284662 - Suda; Masakatsu ; et al.	2006-12-21
Delay circuit, and testing apparatus App 20060267656 - Suda; Masakatsu ; et al.	2006-11-30
Delay device, semiconductor testing device, semiconductor device, and oscilloscope Grant 7,142,031 - Okayasu , et al. November 28, 2	2006-11-28
Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit App 20060217912 - Hasumi; Takuya ; et al.	2006-09-28
Variable delay circuit App 20060170472 - Suda; Masakatsu ; et al.	2006-08-03
Variable delay circuit Grant 7,071,746 - Suda , et al. July 4, 2	2006-07-04
Timing comparator, data sampling apparatus, and testing apparatus Grant 7,034,723 - Suda , et al. April 25, 2	2006-04-25
Clock recovery circuit and communication device Grant 6,987,410 - Suda , et al. January 17, 2	2006-01-17
Variable delay circuit App 20050110548 - Suda, Masakatsu ; et al.	2005-05-26
Clock recovery circuit and communication device App 20050110544 - Suda, Masakatsu ; et al.	2005-05-26
Timing comparator, data sampling apparatus, and testing apparatus App 20050111602 - Suda, Masakatsu ; et al.	2005-05-26
Timing generating apparatus and test apparatus Grant 6,842,061 - Suda , et al. January 11, 2	2005-01-11
Phase-locked loop circuit, delay locked loop circuit, timing generator, semiconductor test instrument, and semiconductor integrated circuit App 20040247066 - Suda, Masakatsu	2004-12-09
Delay device, semiconductor testing device, semiconductor device, and oscilloscope App 20040216014 - Okayasu, Toshiyuki ; et al.	2004-10-28
Timing generating apparatus and test apparatus App 20040207436 - Suda, Masakatsu ; et al.	2004-10-21
Delay device, semiconductor testing device, semiconductor device, and oscilloscope Grant 6,769,082 - Okayasu , et al. July 27, 2	2004-07-27
Delay circuit and ring oscillator Grant 6,717,479 - Suda April 6, 2	2004-04-06
Delay circuit and ring oscillator App 20030048141 - Suda, Masakatsu	2003-03-13
Differential signal transmission circuit Grant 6,208,161 - Suda March 27, 2	2001-03-27

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