loadpatents
name:-0.024244070053101
name:-0.015789985656738
name:-0.0088720321655273
Su; Mei-Mei Patent Filings

Su; Mei-Mei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Su; Mei-Mei.The latest application filed is for "enhanced loopback diagnostic systems and methods".

Company Profile
9.12.20
  • Su; Mei-Mei - Mountain View CA
  • SU; Mei-Mei - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Enhanced Loopback Diagnostic Systems And Methods
App 20210302498 - Su; Mei-Mei ;   et al.
2021-09-30
Universal Test Interface Systems and Methods
App 20210302469 - Su; Mei-Mei
2021-09-30
Test Equipment Diagnostics Systems and Methods
App 20210302501 - Su; Mei-Mei ;   et al.
2021-09-30
Device Interface Board Supporting Devices With Mulitple Different Standards To Inerface With The Same Socket
App 20210278462 - SU; Mei-Mei
2021-09-09
Software And Firmware Support For Device Interface Board Configured To Allow Devices Supporting Multiple Different Standards To Interface With The Same Socket
App 20210278458 - SU; Mei-Mei ;   et al.
2021-09-09
Test system and method
Grant 11,099,228 - Su August 24, 2
2021-08-24
Method and system for acquisition of test data
Grant 11,041,907 - Rogel-Favila , et al. June 22, 2
2021-06-22
Test architecture with an FPGA based test board to simulate a DUT or end-point
Grant 11,009,550 - Champoux , et al. May 18, 2
2021-05-18
Scalable platform for system level testing
Grant 11,002,787 - Wolff , et al. May 11, 2
2021-05-11
Software Directed Firmware Acceleration
App 20210116494 - CHAMPOUX; Duane ;   et al.
2021-04-22
Use Of Host Bus Adapter To Provide Protocol Flexibility In Automated Test Equipment
App 20210117298 - SU; Mei-Mei ;   et al.
2021-04-22
Traffic capture and debugging tools for identifying root causes of device failure during automated testing
Grant 10,929,260 - Hsu , et al. February 23, 2
2021-02-23
Method and system for acquisition of test data
Grant 10,634,723 - Rogel-Favila , et al.
2020-04-28
Method And System For Acquisition Of Test Data
App 20200033408 - ROGEL-FAVILA; Ben ;   et al.
2020-01-30
Traffic Capture And Debugging Tools For Identifying Root Causes Of Device Failure During Automated Testing
App 20190354453 - Hsu; Linden ;   et al.
2019-11-21
Log Post-processor For Identifying Root Causes Of Device Failure During Automated Testing
App 20190278645 - HSU; Linden ;   et al.
2019-09-12
Scalable Platform For System Level Testing
App 20190277907 - WOLFF; Roland ;   et al.
2019-09-12
Test architecture with a small form factor test board for rapid prototyping
Grant 10,288,681 - Champoux , et al.
2019-05-14
Test system and method
Grant 10,241,146 - Su , et al.
2019-03-26
Test architecture having multiple FPGA based hardware accelerator blocks for testing multiple DUTs independently
Grant 10,162,007 - Chan , et al. Dec
2018-12-25
Test System And Method
App 20180313889 - SU; Mei-Mei ;   et al.
2018-11-01
Test Architecture With A Small Form Factor Test Board For Rapid Prototyping
App 20180267101 - CHAMPOUX; Duane ;   et al.
2018-09-20
Test System And Method
App 20180259572 - Su; Mei-Mei
2018-09-13
Test Architecture With An Fpga Based Test Board To Simulate A Dut Or End-point
App 20180196103 - CHAMPOUX; Duane ;   et al.
2018-07-12
Method And System For Acquisition Of Test Data
App 20180188322 - ROGEL-FAVILA; Ben ;   et al.
2018-07-05
Universal test floor system
Grant 9,933,454 - Rogel-Favila , et al. April 3, 2
2018-04-03
High speed tester communication interface between test slice and trays
Grant 9,310,427 - Kushnick , et al. April 12, 2
2016-04-12
Universal Test Floor System
App 20150355229 - ROGEL-FAVILA; Ben ;   et al.
2015-12-10
High Speed Tester Communication Interface Between Test Slice And Trays
App 20150028908 - KUSHNICK; Eric ;   et al.
2015-01-29
Test Architecture Having Multiple Fpga Based Hardware Accelerator Blocks For Testing Multiple Duts Independently
App 20140236525 - CHAN; Gerald ;   et al.
2014-08-21
Dynamic mask memory for serial scan testing
Grant 7,865,788 - Burlison , et al. January 4, 2
2011-01-04
Dynamic Mask Memory For Serial Scan Testing
App 20090132870 - BURLISON; PHILLIP ;   et al.
2009-05-21

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