SU; Jun-Liang
Patent Applications and Registrations
Patent applications and USPTO patent grants for SU; Jun-Liang.The latest application filed is for "methods and apparatus for warpage correction".
- SU; Jun-Liang - SINGAPORE SG
| Patent | Date |
|---|---|
| Methods And Apparatus For Warpage Correction App 20220085268 - THIRUNAVUKARASU; Sriskantharajah ; et al. | 2022-03-17 |
| Methods and apparatus for processing a substrate Grant 11,177,146 - Peng , et al. November 16, 2 | 2021-11-16 |
| Methods And Apparatus For Processing A Substrate App 20210134627 - Peng; Qi Jie ; et al. | 2021-05-06 |
| Methods And Apparatus For Contactless Substrate Warpage Correction App 20210057238 - TAN; CHIN WEI ; et al. | 2021-02-25 |
| Methods And Apparatus For Substrate Warpage Correction App 20210035795 - PENG; Qi Jie ; et al. | 2021-02-04 |
| Next generation warpage measurement system Grant 10,446,423 - Su , et al. Oc | 2019-10-15 |
| Methods and apparatus for correcting substrate deformity Grant 10,325,790 - Peh , et al. | 2019-06-18 |
| Methods And Apparatus For Correcting Substrate Deformity App 20180218928 - PEH; Eng Sheng ; et al. | 2018-08-02 |
| Next Generation Warpage Measurement System App 20180144960 - SU; JUN-LIANG ; et al. | 2018-05-24 |
| Methods and apparatus for correcting substrate deformity Grant 9,818,624 - Lew , et al. November 14, 2 | 2017-11-14 |
| Methods And Apparatus For Correcting Substrate Deformity App 20160322234 - LEW; Jen Sern ; et al. | 2016-11-03 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 