Stuker; Peter
Patent Applications and Registrations
Patent applications and USPTO patent grants for Stuker; Peter.The latest application filed is for "method for measuring the thickness of multi-layer films".
- Stuker; Peter - Rueti CH
- Stuker; Peter - Dietlikon CH
| Patent | Date |
|---|---|
| Method For Measuring The Thickness Of Multi-Layer Films App 20110161036 - Keller; Albert ; et al. | 2011-06-30 |
| Method for Measuring the Thickness of Multi-Layer Films App 20100141274 - Keller; Albert ; et al. | 2010-06-10 |
| Method for Measuring the Thickness of Multi-Layer Films App 20090306923 - Keller; Albert ; et al. | 2009-12-10 |
| Positioning system with pressure measurement in the layer of air between the measuring head and the material being measured Grant 6,029,502 - Stuker February 29, 2 | 2000-02-29 |
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