Stroessner; Ulrich

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stroessner; Ulrich.The latest application filed is for "mask inspection microscope with variable illumination setting".

Company Profile

0.10.9

Stroessner; Ulrich - Jena N/A DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Microscope for reticle inspection with variable illumination settings Grant 9,116,447 - Stroessner August 25, 2	2015-08-25
Method and apparatus for measuring structures on photolithography masks Grant 8,736,849 - Stroessner , et al. May 27, 2	2014-05-27
Method for analyzing masks for photolithography Grant 8,718,354 - Stroessner , et al. May 6, 2	2014-05-06
Mask Inspection Microscope With Variable Illumination Setting App 20120162755 - Stroessner; Ulrich ; et al.	2012-06-28
Method And Apparatus For Measuring Structures On Photolithography Masks App 20110242544 - Stroessner; Ulrich ; et al.	2011-10-06
Method For Analyzing Masks For Photolithography App 20110188732 - STROESSNER; ULRICH	2011-08-04
Microscope For Reticle Inspection With Variable Illumination Settings App 20110164313 - Stroessner; Ulrich	2011-07-07
Method for determining intensity distribution in the image plane of a projection exposure arrangement Grant 7,961,297 - Greif-Wuestenbecker , et al. June 14, 2	2011-06-14
Apparatus And Method For Measuring The Positions Of Marks On A Mask App 20100153059 - Klose; Gerd ; et al.	2010-06-17
Method and device for analysing the imaging behavior of an optical imaging element Grant 7,626,689 - Stroessner , et al. December 1, 2	2009-12-01
Imaging system for emulation of a high aperture scanning system Grant 7,535,640 - Totzeck , et al. May 19, 2	2009-05-19
Method for Determining Intensity Distribution in the Image Plane of a Projection Exposure Arrangement App 20080212060 - Greif-Wuestenbecker; Joern ; et al.	2008-09-04
Microscope imaging system and method for emulating a high aperture imaging system, particularly for mask inspection Grant 7,286,284 - Totzeck , et al. October 23, 2	2007-10-23
Polarizer device for generating a defined spatial distribution of polarization states App 20060028706 - Totzeck; Michael ; et al.	2006-02-09
Microscope imaging system and method for emulating a high aperture imaging system, particularly for mask inspection App 20060012873 - Totzeck; Michael ; et al.	2006-01-19
Imaging system for emulation of a high aperture scanning system App 20060007541 - Totzeck; Michael ; et al.	2006-01-12

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