Strid; Eric

Patent Applications and Registrations

Patent applications and USPTO patent grants for Strid; Eric.The latest application filed is for "resilient electrical interposers, systems that include the interposers, and methods for using and forming the same".

Company Profile

0.9.13

Strid; Eric - Portland OR
Strid; Eric - Portand OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 9,874,585 - Smith , et al. January 23, 2	2018-01-23
Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20150301082 - Smith; Kenneth R. ; et al.	2015-10-22
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 9,099,449 - Smith , et al. August 4, 2	2015-08-04
Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20150114925 - Smith; Kenneth R. ; et al.	2015-04-30
Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same Grant 8,970,240 - Smith , et al. March 3, 2	2015-03-03
Systems, Devices, And Methods For Two-sided Testing Of Electronic Devices App 20130015871 - Cleary; Tim ; et al.	2013-01-17
Resilient Electrical Interposers, Systems That Include The Interposers, And Methods For Using And Forming The Same App 20120112779 - Smith; Kenneth R. ; et al.	2012-05-10
Differential Signal Probing System App 20100264948 - Strid; Eric ; et al.	2010-10-21
Active Wafer Probe App 20100253377 - Strid; Eric ; et al.	2010-10-07
Differential signal probing system Grant 7,764,072 - Strid , et al. July 27, 2	2010-07-27
Active wafer probe Grant 7,759,953 - Strid , et al. July 20, 2	2010-07-20
Calibration structures for differential signal probing Grant 7,723,999 - Strid , et al. May 25, 2	2010-05-25
On-wafer test structures App 20090021273 - Strid; Eric ; et al.	2009-01-22
Active wafer probe App 20080309358 - Strid; Eric ; et al.	2008-12-18
On-wafer test structures for differential signals Grant 7,443,186 - Strid , et al. October 28, 2	2008-10-28
Active wafer probe Grant 7,427,868 - Strid , et al. September 23, 2	2008-09-23
On-wafer test structures App 20070285112 - Strid; Eric ; et al.	2007-12-13
Calibration structures for differential signal probing App 20070285107 - Strid; Eric ; et al.	2007-12-13
Differential signal probing system App 20070285085 - Strid; Eric ; et al.	2007-12-13
Active wafer probe App 20050140386 - Strid, Eric ; et al.	2005-06-30

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.