name:-0.047152996063232
name:-0.061857938766479
name:-0.00054502487182617
Strasbaugh Patent Filings

Strasbaugh

Patent Applications and Registrations

Patent applications and USPTO patent grants for Strasbaugh.The latest application filed is for "method of grinding wafer stacks to provide uniform residual silicon thickness".

Company Profile
0.65.49
  • Strasbaugh - San Luis Obispo CA US
  • Strasbaugh -
  • Strasbaugh - San Louis Obispo CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Methods and systems for use in grind spindle alignment
Grant 9,610,669 - Walsh , et al. April 4, 2
2017-04-04
Methods and systems for use in grind shape control adaptation
Grant 9,457,446 - Brake , et al. October 4, 2
2016-10-04
Systems and methods of processing substrates
Grant 9,393,669 - Kalenian , et al. July 19, 2
2016-07-19
CMP retaining ring with soft retaining ring insert
Grant 9,193,030 - Kalenian , et al. November 24, 2
2015-11-24
Method of grinding wafer stacks to provide uniform residual silicon thickness
Grant 9,082,713 - Brake , et al. July 14, 2
2015-07-14
Method Of Grinding Wafer Stacks To Provide Uniform Residual Silicon Thickness
App 20150118826 - Kalenian; William J. ;   et al.
2015-04-30
Systems and methods of wafer grinding
Grant 8,968,052 - Walsh , et al. March 3, 2
2015-03-03
Cmp Retaining Ring With Soft Retaining Ring Insert
App 20140287657 - Kalenian; William J. ;   et al.
2014-09-25
CMP retaining ring with soft retaining ring insert
Grant 8,740,673 - Kalenian , et al. June 3, 2
2014-06-03
Methods And Systems For Use In Grind Shape Control Adaptation
App 20140134923 - Brake; Thomas E. ;   et al.
2014-05-15
Methods And Systems For Use In Grind Spindle Alignment
App 20140134927 - Walsh; Thomas A. ;   et al.
2014-05-15
Method, apparatus and system for use in processing wafers
Grant 8,565,919 - Kalenian , et al. October 22, 2
2013-10-22
System and method for in situ monitoring of top wafer thickness in a stack of wafers
Grant 8,520,222 - Schraub , et al. August 27, 2
2013-08-27
Systems And Methods Of Processing Substrates
App 20130130593 - Kalenian; William J. ;   et al.
2013-05-23
System and Method for In Situ Monitoring of Top Wafer Thickness in a Stack of Wafers
App 20130114090 - Schraub; Frederic Anthony ;   et al.
2013-05-09
Systems And Methods Of Wafer Grinding
App 20130102227 - Walsh; Thomas A. ;   et al.
2013-04-25
Wafer Carrier with Flexible Pressure Plate
App 20130078812 - Spiegel; Larry A. ;   et al.
2013-03-28
CMP system with wireless endpoint detection system
Grant 8,182,312 - Truer , et al. May 22, 2
2012-05-22
CMP Retaining Ring with Soft Retaining Ring Insert
App 20120088366 - Kalenian; William J. ;   et al.
2012-04-12
Method, apparatus and system for use in processing wafers
Grant 8,052,504 - Kalenian , et al. November 8, 2
2011-11-08
Flexible membrane assembly for a CMP system and method of using
Grant 7,959,496 - Spiegel June 14, 2
2011-06-14
Endpoint detection system for wafer polishing
Grant 7,918,712 - Wolf April 5, 2
2011-04-05
CMP System with Wireless Endpoint Detection System
App 20100062685 - Truer; Randolph E. ;   et al.
2010-03-11
Flexible Membrane Assembly for a CMP System
App 20090176445 - Spiegel; Larry A.
2009-07-09
Methods for optical endpoint detection during semiconductor wafer polishing
Grant 7,549,909 - Dalrymple , et al. June 23, 2
2009-06-23
Robot calibration system and method
Grant 7,551,979 - Saraliev June 23, 2
2009-06-23
Endpoint detection system for wafer polishing
App 20090061734 - Wolf; Stephan H.
2009-03-05
Back pressure control system for CMP and wafer polishing
Grant 7,467,990 - Strasbaugh December 23, 2
2008-12-23
Devices and Methods for Optical Endpoint Detection During Semiconductor Wafer Polishing
App 20080032602 - Dalrymple; Alice Madrone ;   et al.
2008-02-07
Method, Apparatus And System For Use In Processing Wafers
App 20070269986 - Kalenian; William J. ;   et al.
2007-11-22
Devices and methods for measuring wafer characteristics during semiconductor wafer polishing
App 20070235133 - Benassi; Robert
2007-10-11
Method, apparatus and system for use in processing wafers
Grant 7,249,992 - Kalenian , et al. July 31, 2
2007-07-31
Wafer carrier with pressurized membrane and retaining ring actuator
Grant 7,238,083 - Fuhriman , et al. July 3, 2
2007-07-03
Robot calibration system and method
App 20070150100 - Saraliev; Daniel P.
2007-06-28
Devices and methods for optical endpoint detection during semiconductor wafer polishing
Grant 7,235,154 - Dalrymple , et al. June 26, 2
2007-06-26
Wafer Carrier Pivot Mechanism
App 20070105491 - Walsh; Thomas A. ;   et al.
2007-05-10
Endpoint detection system for wafer polishing
Grant 7,195,541 - Wolf March 27, 2
2007-03-27
Wafer carrier with pressurized membrane and retaining ring actuator
App 20070054603 - Fuhriman; John ;   et al.
2007-03-08
Polishing pad with built-in optical sensor
App 20070032170 - Halley; David G. ;   et al.
2007-02-08
Independent edge control for CMP carriers
App 20070010181 - Spiegel; Larry A.
2007-01-11
Chuck for supporting wafers with a fluid
Grant 7,160,808 - Kassir January 9, 2
2007-01-09
Wafer carrier pivot mechanism
Grant 7,156,946 - Walsh , et al. January 2, 2
2007-01-02
Wafer carrier with pressurized membrane and retaining ring actuator
Grant 7,131,892 - Fuhriman , et al. November 7, 2
2006-11-07
Endpoint detection system for wafer polishing
App 20060217038 - Wolf; Stephan H.
2006-09-28
Chemical-mechanical planarization tool force calibration method and system
App 20060205322 - Kalenian; William ;   et al.
2006-09-14
Wafer Carrier With Pressurized Membrane And Retaining Ring Actuator
App 20060194519 - Fuhriman; John ;   et al.
2006-08-31
Back pressure control system for CMP and wafer polishing
App 20060166611 - Strasbaugh; Alan
2006-07-27
Independent edge control for CMP carriers
Grant 7,063,604 - Spiegel June 20, 2
2006-06-20
Retaining ring for wafer carriers
Grant 7,063,605 - Spiegel June 20, 2
2006-06-20
Method of backgrinding wafers while leaving backgrinding tape on a chuck
Grant 7,059,942 - Strasbaugh , et al. June 13, 2
2006-06-13
Endpoint detection system for wafer polishing
Grant 7,052,366 - Wolf May 30, 2
2006-05-30
Chemical-mechanical planarization tool force calibration method and system
Grant 7,040,955 - Kalenian , et al. May 9, 2
2006-05-09
Wafer carrier with pressurized membrane and retaining ring actuator
Grant 7,033,252 - Fuhriman , et al. April 25, 2
2006-04-25
Protection of work piece during surface processing
Grant 7,018,268 - Kassir , et al. March 28, 2
2006-03-28
Back pressure control system for CMP and wafer polishing
Grant 7,008,309 - Strasbaugh March 7, 2
2006-03-07
Method, apparatus and system for use in processing wafers
App 20060035563 - Kalenian; William J. ;   et al.
2006-02-16
Polishing pad with built-in optical sensor
Grant 6,986,701 - Halley , et al. January 17, 2
2006-01-17
In situ feature height measurement
Grant 6,976,901 - Halley , et al. December 20, 2
2005-12-20
Wafer carrier with pressurized membrane and retaining ring actuator
App 20050215182 - Fuhriman, John ;   et al.
2005-09-29
Subaperture chemical mechanical planarization with polishing pad conditioning
Grant 6,945,856 - Boyd , et al. September 20, 2
2005-09-20
Independent edge control for CMP carriers
App 20050202765 - Spiegel, Larry A.
2005-09-15
Retaining ring for wafer carriers
App 20050164617 - Spiegel, Larry A.
2005-07-28
Devices and methods for optical endpoint detection during semiconductor wafer polishing
App 20050150599 - Dalrymple, Alice Madrone ;   et al.
2005-07-14
Pad support method for chemical mechanical planarization
Grant 6,887,133 - Halley May 3, 2
2005-05-03
Polishing pad sensor assembly with a damping pad
Grant 6,884,150 - Barbour April 26, 2
2005-04-26
Device for supporting thin semiconductor wafers
Grant 6,885,206 - Halley April 26, 2
2005-04-26
Slurry pump control system
Grant 6,878,037 - Melcer April 12, 2
2005-04-12
Retaining Ring For Wafer Carriers
App 20050075062 - Spiegel, Larry A.
2005-04-07
Retaining ring for wafer carriers
Grant 6,869,348 - Spiegel March 22, 2
2005-03-22
Method of backgrinding wafers while leaving backgrinding tape on a chuck
Grant 6,866,564 - Strasbaugh , et al. March 15, 2
2005-03-15
Modular method for chemical mechanical planarization
Grant 6,855,030 - Halley February 15, 2
2005-02-15
Chuck for supporting wafers with a fluid
App 20050009349 - Kassir, Salman M.
2005-01-13
Polishing pad with built-in optical sensor
App 20050009449 - Halley, David G. ;   et al.
2005-01-13
Back pressure control system for CMP and wafer polishing
App 20040242135 - Strasbaugh, Alan
2004-12-02
Endpoint detection system for wafer polishing
App 20040229545 - Wolf, Stephan H.
2004-11-18
Wafer carrier pivot mechanism
App 20040226656 - Walsh, Thomas A. ;   et al.
2004-11-18
Grinding apparatus and method
App 20040198196 - Walsh, Thomas A. ;   et al.
2004-10-07
Method of backgrinding wafers while leaving backgrinding tape on a chuck
App 20040157536 - Strasbaugh, Alan ;   et al.
2004-08-12
Support for thin wafers
App 20040155671 - Halley, David G.
2004-08-12
Slurry pump control system
App 20040142636 - Melcer, Chris
2004-07-22
Method of spin etching wafers with an alkali solution
Grant 6,743,722 - Kassir June 1, 2
2004-06-01
Polishing pad with built-in optical sensor
Grant 6,739,945 - Halley , et al. May 25, 2
2004-05-25
Polishing pad with optical sensor
Grant 6,726,528 - Barbour April 27, 2
2004-04-27
Modular method for chemical mechanical planarization
App 20040048550 - Halley, David G.
2004-03-11
Endpoint detection system for wafer polishing
Grant 6,695,681 - Wolf February 24, 2
2004-02-24
Method for making a polishing pad with built-in optical sensor
Grant 6,696,005 - Strasbaugh February 24, 2
2004-02-24
Combined chemical mechanical planarization and cleaning
Grant 6,692,339 - Halley February 17, 2
2004-02-17
Method for applying an insert or tape to chucks or wafer carriers used for grinding, polishing, or planarizing wafers
Grant 6,638,389 - Kassir , et al. October 28, 2
2003-10-28
Feature height measurement during CMP
Grant 6,629,874 - Halley October 7, 2
2003-10-07
Subaperture chemical mechanical planarization with polishing pad conditioning
App 20030153250 - Boyd, John M. ;   et al.
2003-08-14
Pad support apparatus for chemical mechanical planarization
Grant 6,602,121 - Halley August 5, 2
2003-08-05
Method of backgrinding wafers while leaving backgrinding tape on a chuck
App 20030134578 - Strasbaugh, Alan ;   et al.
2003-07-17
Endpoint detection system for wafer polishing
App 20030109196 - Wolf, Stephan H.
2003-06-12
High planarity chemical mechanical planarization
Grant 6,520,843 - Halley February 18, 2
2003-02-18
Shaping polishing pad for small head chemical mechanical planarization
Grant 6,517,419 - Halley February 11, 2
2003-02-11
Polishing chemical delivery for small head chemical mechanical planarization
Grant 6,514,121 - Halley February 4, 2
2003-02-04
Pad quick release device for chemical mechanical planarization
Grant 6,464,574 - Halley October 15, 2
2002-10-15
Multi-pad apparatus for chemical mechanical planarization
Grant 6,346,036 - Halley February 12, 2
2002-02-12
Pad quick release device for chemical mechanical polishing
Grant 6,227,956 - Halley May 8, 2
2001-05-08
Chemical mechanical polishing apparatus and method
Grant 6,045,716 - Walsh , et al. April 4, 2
2000-04-04
Grinding process and apparatus for planarizing sawed wafers
Grant 5,964,646 - Kassir , et al. October 12, 1
1999-10-12
Apparatus for sensing the presence of a wafer
Grant 5,961,169 - Kalenian , et al. October 5, 1
1999-10-05
Company Registrations

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