loadpatents
Patent applications and USPTO patent grants for Strain; Robert J..The latest application filed is for "reduced variation mosfet using a drain-extension-last process".
Patent | Date |
---|---|
FFT-dram Grant 11,373,696 - Thomas , et al. June 28, 2 | 2022-06-28 |
Fluctuation resistant FinFET Grant 9,847,404 - Strain , et al. December 19, 2 | 2017-12-19 |
Reduced Variation MOSFET Using a Drain-Extension-Last Process App 20160260816 - Kapoor; Ashok K. ;   et al. | 2016-09-08 |
Reduced variation MOSFET using a drain-extension-last process Grant 9,379,214 - Kapoor , et al. June 28, 2 | 2016-06-28 |
Reduced Variation MOSFET Using a Drain-Extension-Last Process App 20150236117 - Kapoor; Ashok K. ;   et al. | 2015-08-20 |
Fluctuation Resistant FinFET App 20150008490 - Strain; Robert J. ;   et al. | 2015-01-08 |
Random Doping Fluctuation Resistant FinFET App 20140103437 - Kapoor; Ashok K. ;   et al. | 2014-04-17 |
Gate defined Schottky diode Grant 7,544,557 - Levin , et al. June 9, 2 | 2009-06-09 |
Cobalt silicide schottky diode on isolated well Grant 7,485,941 - Levin , et al. February 3, 2 | 2009-02-03 |
Cobalt silicide schottky diode on isolated well App 20060125040 - Levin; Sharon ;   et al. | 2006-06-15 |
Gate defined schottky diode App 20060125019 - Levin; Sharon ;   et al. | 2006-06-15 |
Mask programmable read-only memory (ROM) cell Grant 6,809,948 - Nachumovsky , et al. October 26, 2 | 2004-10-26 |
Multi-bit programmable memory cell having multiple anti-fuse elements App 20030223291 - Nachumovsky, Ishai ;   et al. | 2003-12-04 |
Multi-bit programmable memory cell having multiple anti-fuse elements Grant 6,590,797 - Nachumovsky , et al. July 8, 2 | 2003-07-08 |
Tuneable microelectromechanical system resonator Grant 5,729,075 - Strain March 17, 1 | 1998-03-17 |
Multiple gap read/write head for data storage devices Grant 5,644,457 - Llewellyn , et al. July 1, 1 | 1997-07-01 |
Defect-free bipolar process Grant 5,453,389 - Strain , et al. September 26, 1 | 1995-09-26 |
CMOS circuit having a reduced tendency to latch Grant 4,728,998 - Strain March 1, 1 | 1988-03-01 |
Method for making a CMOS circuit having a reduced tendency to latch by controlling the band-gap of source and drain regions Grant 4,603,471 - Strain August 5, 1 | 1986-08-05 |
Process for fabricating optical wave-guiding components and components made by the process Grant 4,585,299 - Strain April 29, 1 | 1986-04-29 |
Ion implantation to increase emitter energy gap in bipolar transistors Grant 4,559,696 - Anand , et al. December 24, 1 | 1985-12-24 |
Identification of repaired integrated circuits Grant 4,480,199 - Varshney , et al. October 30, 1 | 1984-10-30 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.