| Patent | Date |
|---|
Fiducial design for tilted or glancing mill operations with a charged particle beam
Grant 11,315,756 - Stone , et al. April 26, 2 | 2022-04-26 |
Automated TEM sample preparation
Grant 10,825,651 - Brogden , et al. November 3, 2 | 2020-11-03 |
Automated Tem Sample Preparation
App 20190272975 - Brogden; Valerie ; et al. | 2019-09-05 |
Automated TEM sample preparation
Grant 10,340,119 - Brogden , et al. | 2019-07-02 |
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella
Grant 10,283,317 - Keady , et al. | 2019-05-07 |
Fiducial Design For Tilted Or Glancing Mill Operations With A Charged Particle Beam
App 20180301319 - Stone; Stacey ; et al. | 2018-10-18 |
Fiducial design for tilted or glancing mill operations with a charged particle beam
Grant 10,026,590 - Stone , et al. July 17, 2 | 2018-07-17 |
Automated Tem Sample Preparation
App 20170256380 - Brogden; Valerie ; et al. | 2017-09-07 |
High Throughput Tem Preparation Processes And Hardware For Backside Thinning Of Cross-sectional View Lamella
App 20170250055 - Keady; Paul ; et al. | 2017-08-31 |
High aspect ratio structure analysis
Grant 9,741,536 - Lee , et al. August 22, 2 | 2017-08-22 |
Multidimensional structural access
Grant 9,696,372 - Blackwood , et al. July 4, 2 | 2017-07-04 |
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella
Grant 9,653,260 - Keady , et al. May 16, 2 | 2017-05-16 |
Automated TEM sample preparation
Grant 9,601,313 - Brogden , et al. March 21, 2 | 2017-03-21 |
Method and system for reducing curtaining in charged particle beam sample preparation
Grant 9,488,554 - Schmidt , et al. November 8, 2 | 2016-11-08 |
Bulk deposition for tilted mill protection
Grant 9,412,560 - Stone , et al. August 9, 2 | 2016-08-09 |
Depositing material into high aspect ratio structures
Grant 9,384,982 - Lee , et al. July 5, 2 | 2016-07-05 |
Automated Tem Sample Preparation
App 20160141147 - Brogden; Valerie ; et al. | 2016-05-19 |
Method for creating S/TEM sample and sample structure
Grant 9,336,985 - Blackwood , et al. May 10, 2 | 2016-05-10 |
Method for preparing thin samples for TEM imaging
Grant 9,279,752 - Moriarty , et al. March 8, 2 | 2016-03-08 |
Protective layer for charged particle beam processing
Grant 9,263,306 - Blackwood , et al. February 16, 2 | 2016-02-16 |
Fiducial Design for Tilted or Glancing Mill Operations with a Charged Particle Beam
App 20150357159 - Stone; Stacey ; et al. | 2015-12-10 |
Depositing Material Into High Aspect Ratio Structures
App 20150340235 - Lee; Sang Hoon ; et al. | 2015-11-26 |
Method For Preparing Samples For Imaging
App 20150330877 - Schmidt; Michael ; et al. | 2015-11-19 |
Method For Creating S/tem Sample And Sample Structure
App 20150323429 - Blackwood; Jeffrey ; et al. | 2015-11-12 |
Method and System for Reducing Curtaining in Charged Particle Beam Sample Preparation
App 20150276567 - Schmidt; Michael ; et al. | 2015-10-01 |
Multidimensional Structural Access
App 20150260784 - Blackwood; Jeffrey ; et al. | 2015-09-17 |
High Aspect Ratio Structure Analysis
App 20150243478 - Lee; Sang Hoon ; et al. | 2015-08-27 |
Bulk Deposition for Tilted Mill Protection
App 20150243477 - Stone; Stacey ; et al. | 2015-08-27 |
Method for preparing samples for imaging
Grant 9,111,720 - Kelley , et al. August 18, 2 | 2015-08-18 |
Method For Preparing Samples For Imaging
App 20150179402 - Kelley; Ronald ; et al. | 2015-06-25 |
Method For Preparing Thin Samples For Tem Imaging
App 20150102009 - Moriarty; Michael ; et al. | 2015-04-16 |
Method for creating S/TEM sample and sample structure
Grant 9,006,651 - Blackwood , et al. April 14, 2 | 2015-04-14 |
Method for preparing samples for imaging
Grant 8,912,490 - Kelley , et al. December 16, 2 | 2014-12-16 |
Methods for preparing thin samples for TEM imaging
Grant 8,859,963 - Moriarty , et al. October 14, 2 | 2014-10-14 |
Method for preparing samples for imaging
Grant 8,822,921 - Schmidt , et al. September 2, 2 | 2014-09-02 |
Method For Preparing Samples For Imaging
App 20140190934 - Schmidt; Michael ; et al. | 2014-07-10 |
Multiple sample attachment to nano manipulator for high throughput sample preparation
Grant 8,729,469 - Schmidt , et al. May 20, 2 | 2014-05-20 |
Method For Creating S/tem Sample And Sample Structure
App 20140116873 - Blackwood; Jeffrey ; et al. | 2014-05-01 |
High Throughput TEM Preparation Processes and Hardware for Backside Thinning of Cross-Sectional View Lamella
App 20130248354 - Keady; Paul ; et al. | 2013-09-26 |
Method for creating S/TEM sample and sample structure
Grant 8,536,525 - Blackwood , et al. September 17, 2 | 2013-09-17 |
Method for creating S/TEM sample and sample structure
Grant 8,525,137 - Blackwood , et al. September 3, 2 | 2013-09-03 |
Methods For Preparing Thin Samples For Tem Imaging
App 20130143412 - Moriarty; Michael ; et al. | 2013-06-06 |
Method For Creating S/tem Sample And Sample Structure
App 20120152731 - Blackwood; Jeff ; et al. | 2012-06-21 |
Protective Layer For Charged Particle Beam Processing
App 20120107521 - Blackwood; Jeff ; et al. | 2012-05-03 |
Method for creating S/tem sample and sample structure
Grant 8,134,124 - Blackwood , et al. March 13, 2 | 2012-03-13 |
Protective layer for charged particle beam processing
Grant 8,097,308 - Blackwood , et al. January 17, 2 | 2012-01-17 |
Method For Creating S/tem Sample And Sample Structure
App 20100308219 - Blackwood; Jeff ; et al. | 2010-12-09 |
Method For Creating S/tem Sample And Sample Structure
App 20100300873 - Blackwood; Jeff ; et al. | 2010-12-02 |
Protective Layer For Charged Particle Beam Processing
App 20080102224 - BLACKWOOD; JEFF ; et al. | 2008-05-01 |
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