Stokowski; Stanley
Patent Applications and Registrations
Patent applications and USPTO patent grants for Stokowski; Stanley.The latest application filed is for "system for detecting anomalies and/or features of a surface".
- Stokowski; Stanley - Danville CA
| Patent | Date |
|---|---|
| System for detecting anomalies and/or features of a surface Grant 7,869,023 - Zhao , et al. January 11, 2 | 2011-01-11 |
| System For Detecting Anomalies And/Or Features of a Surface App 20080218762 - Zhao; Guoheng ; et al. | 2008-09-11 |
| System For Detecting Anomalies And/or Features Of A Surface App 20080002193 - Zhao; Guoheng ; et al. | 2008-01-03 |
| System for detecting anomalies and/or features of a surface Grant 7,280,199 - Zhao , et al. October 9, 2 | 2007-10-09 |
| Sample inspection system Grant 7,119,897 - Vaez-Iravani , et al. October 10, 2 | 2006-10-10 |
| Sample inspection system Grant 7,079,238 - Vaez-Iravani , et al. July 18, 2 | 2006-07-18 |
| Sample inspection system Grant 7,064,821 - Vaez-Iravani , et al. June 20, 2 | 2006-06-20 |
| Sample inspection system App 20050206886 - Vaez-Iravani, Mehdi ; et al. | 2005-09-22 |
| Sample inspection system App 20050174568 - Vaez-Iravani, Mehdi ; et al. | 2005-08-11 |
| Sample inspection system App 20050134841 - Vacz-Iravani, Mehdi ; et al. | 2005-06-23 |
| Sample inspection system App 20050099621 - Vaez-Iravani, Mehdi ; et al. | 2005-05-12 |
| Sample inspection system Grant 6,891,611 - Vaez-Iravani , et al. May 10, 2 | 2005-05-10 |
| System for detecting anomalies and / or features of a surface App 20050036138 - Zhao, Guoheng ; et al. | 2005-02-17 |
| Sample inspection system App 20040057045 - Vaez-Iravani, Mehdi ; et al. | 2004-03-25 |
| System for detecting anomalies and/or features of a surface App 20040036864 - Zhao, Guoheng ; et al. | 2004-02-26 |
| Sample inspection system Grant 6,657,715 - Vaez-Iravani , et al. December 2, 2 | 2003-12-02 |
| Sample inspection system App 20030206295 - Vaez-Iravani, Mehdi ; et al. | 2003-11-06 |
| Sample inspection system Grant 6,639,662 - Vaez-Iravani , et al. October 28, 2 | 2003-10-28 |
| Sample inspection system Grant 6,618,134 - Vaez-Iravani , et al. September 9, 2 | 2003-09-09 |
| System for detecting anomalies and/or features of a surface Grant 6,608,676 - Zhao , et al. August 19, 2 | 2003-08-19 |
| Sample inspection system App 20020080346 - Vaez-Iravani, Mehdi ; et al. | 2002-06-27 |
| Sample inspection system Grant 6,384,910 - Vaez-Iravani , et al. May 7, 2 | 2002-05-07 |
| Sample inspection system App 20010002149 - Vaez-Iravani, Mehdi ; et al. | 2001-05-31 |
| Sample inspection system App 20010000977 - Vaez-Iravani, Mehdi ; et al. | 2001-05-10 |
| Sample inspection system App 20010000679 - Vaez-Iravani, Mehdi ; et al. | 2001-05-03 |
| Sample inspection system Grant 6,201,601 - Vaez-Iravani , et al. March 13, 2 | 2001-03-13 |
| Particle detection on a patterned or bare wafer surface Grant 5,076,692 - Neukermans , et al. December 31, 1 | 1991-12-31 |
| Photoemission contaminant detector Grant 4,998,019 - Stokowski , et al. March 5, 1 | 1991-03-05 |
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