Stokowski; Stan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stokowski; Stan.The latest application filed is for "methods for detecting and classifying defects on a reticle".

Company Profile

0.11.4

Stokowski; Stan - Danville CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Enhanced focusing capability on a sample using a spot matrix Grant 8,194,240 - Vaez-Iravani , et al. June 5, 2	2012-06-05
Methods for detecting and classifying defects on a reticle Grant 7,738,093 - Alles , et al. June 15, 2	2010-06-15
System and method for reducing speckle noise in die-to-die inspection systems Grant 7,738,092 - Stokowski June 15, 2	2010-06-15
Methods For Detecting And Classifying Defects On A Reticle App 20080304056 - Alles; David ; et al.	2008-12-11
Methods and systems for reticle inspection and defect review using aerial imaging Grant 7,379,175 - Stokowski , et al. May 27, 2	2008-05-27
Systems for simulating high NA and polarization effects in aerial images Grant 7,133,119 - Pettibone , et al. November 7, 2	2006-11-07
Methods and systems for inspecting reticles using aerial imaging and die-to-database detection Grant 7,123,356 - Stokowski , et al. October 17, 2	2006-10-17
Methods and systems for inspecting reticles using aerial imaging at off-stepper wavelengths Grant 7,027,143 - Stokowski , et al. April 11, 2	2006-04-11
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection Grant 6,922,236 - Vaez-Iravani , et al. July 26, 2	2005-07-26
Apparatus and methods for removing optical abberations during an optical inspection Grant 6,844,927 - Stokowski , et al. January 18, 2	2005-01-18
Apparatus and methods for removing optical abberations during an optical inspection App 20040100629 - Stokowski, Stan ; et al.	2004-05-27
Method and system for detecting phase defects in lithographic masks and semiconductor wafers Grant 6,727,512 - Stokowski , et al. April 27, 2	2004-04-27
Method and system for detecting phase defects in lithographic masks and semiconductor wafers App 20040016897 - Stokowski, Stan ; et al.	2004-01-29
Differential detector coupled with defocus for improved phase defect sensitivity Grant 6,646,281 - Krantz , et al. November 11, 2	2003-11-11
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection App 20030011760 - Vaez-Iravani, Mehdi ; et al.	2003-01-16

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