Stine; Brian E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stine; Brian E..The latest application filed is for "characterization vehicles for printed circuit board and system design".

Company Profile

2.17.11

Stine; Brian E. - Santa Clara CA
Stine; Brian E - Santa Clara CA
Stine; Brian E. - Los Altos Hills CA
Stine; Brian E. - Tokyo JP
Stine; Brian E. - Los Altos CA
Stine; Brian E. - Tokyo-to JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Characterization vehicles for printed circuit board and system design Grant 10,897,814 - Stine January 19, 2	2021-01-19
Characterization Vehicles For Printed Circuit Board And System Design App 20200120791 - Stine; Brian E.	2020-04-16
Characterization vehicles for printed circuit board and system design Grant 10,517,169 - Stine Dec	2019-12-24
Characterization Vehicles For Printed Circuit Board And System Design App 20190320525 - Stine; Brian E.	2019-10-17
System and method for product yield prediction Grant 7,673,262 - Stine , et al. March 2, 2	2010-03-02
Identifying yield-relevant process parameters in integrated circuit device fabrication processes Grant 7,494,893 - Inani , et al. February 24, 2	2009-02-24
System And Method For Product Yield Prediction App 20080282210 - Stine; Brian E. ; et al.	2008-11-13
System and method for product yield prediction Grant 7,373,625 - Stine , et al. May 13, 2	2008-05-13
System and method for product yield prediction Grant 7,356,800 - Stine , et al. April 8, 2	2008-04-08
Test structures and models for estimating the yield impact of dishing and/or voids Grant 7,348,594 - Ciplickas , et al. March 25, 2	2008-03-25
Method and system for ROM coding to improve yield Grant 7,305,638 - Stine December 4, 2	2007-12-04
System and method for product yield prediction App 20070118242 - Stine; Brian E. ; et al.	2007-05-24
Test structures for estimating dishing and erosion effects in copper damascene technology Grant 7,197,726 - Ciplickas , et al. March 27, 2	2007-03-27
System and method for product yield prediction Grant 7,174,521 - Stine , et al. February 6, 2	2007-02-06
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure Grant 7,154,115 - Stine , et al. December 26, 2	2006-12-26
System and method for product yield prediction App 20060277506 - Stine; Brian E. ; et al.	2006-12-07
Extraction method of defect density and size distributions Grant 7,024,642 - Hess , et al. April 4, 2	2006-04-04
System and method for product yield prediction App 20050158888 - Stine, Brian E. ; et al.	2005-07-21
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure App 20050122123 - Stine, Brian E. ; et al.	2005-06-09
System and method for product yield prediction Grant 6,901,564 - Stine , et al. May 31, 2	2005-05-31
Test structures and models for estimating the yield impact of dishing and/or voids App 20050074908 - Ciplickas, Dennis J. ; et al.	2005-04-07
System and method for product yield prediction using a logic characterization vehicle Grant 6,834,375 - Stine , et al. December 21, 2	2004-12-21
Test structures for estimating dishing and erosion effects in copper damascene technology App 20040232910 - Ciplickas, Dennis J ; et al.	2004-11-25
System and method for product yield prediction using device and process neighborhood characterization vehicle Grant 6,795,952 - Stine , et al. September 21, 2	2004-09-21
Extraction method of defect density and size distributions App 20040094762 - Hess, Christopher ; et al.	2004-05-20
System and method for product yield prediction App 20030145292 - Stine, Brian E. ; et al.	2003-07-31
Passive multiplexor test structure for integrated circuit manufacturing Grant 6,475,871 - Stine , et al. November 5, 2	2002-11-05
System and method for product yield prediction Grant 6,449,749 - Stine September 10, 2	2002-09-10

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