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Patent applications and USPTO patent grants for Stevie; Fred Anthony.The latest application filed is for "calibration standard for high resolution electron microscopy".
Patent | Date |
---|---|
Calibration standard for high resolution electron microscopy Grant 6,750,447 - Houge , et al. June 15, 2 | 2004-06-15 |
Abnormal photoresist line/space profile detection through signal processing of metrology waveform Grant 6,708,574 - Houge , et al. March 23, 2 | 2004-03-23 |
Calibration standard for high resolution electron microscopy App 20030193022 - Houge, Erik Cho ;   et al. | 2003-10-16 |
Mass spectrometer particle counter Grant 6,633,032 - Houge , et al. October 14, 2 | 2003-10-14 |
Monitoring system for determining progress in a fabrication activity Grant 6,569,690 - Houge , et al. May 27, 2 | 2003-05-27 |
Probe for scanning probe microscopy and related methods Grant 6,405,584 - Bindell , et al. June 18, 2 | 2002-06-18 |
Method Of Determining The Shape Of A Probe For A Stylus Profilometer App 20020062572 - Bindell, Jeffrey Bruce ;   et al. | 2002-05-30 |
Mass spectrometer particle counter App 20020063201 - Houge, Erik Cho ;   et al. | 2002-05-30 |
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