Stelzl; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stelzl; Michael.The latest application filed is for "apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatus".

Company Profile

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Stelzl; Michael - Mainz DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatus Grant 9,546,967 - Schrader , et al. January 17, 2	2017-01-17
Method and device for detecting cracks in semiconductor substrates Grant 9,157,869 - Ortner , et al. October 13, 2	2015-10-13
Apparatus And Method For Identifying Defects Within The Volume Of A Transparent Sheet And Use Of The Apparatus App 20140347664 - Schrader; Bruno ; et al.	2014-11-27
Method And Device For Detecting Cracks In Semiconductor Substrates App 20120307236 - Ortner; Andreas ; et al.	2012-12-06
Method and device for generating digital still pictures of wafer-shaped elements during a production process Grant 8,233,697 - Stelzl July 31, 2	2012-07-31
Method and device for generating digital still pictures of wafer-shaped elements during a production process App 20100061621 - Stelzl; Michael	2010-03-11
Standard for referencing luminescence signals Grant 7,521,670 - Engel , et al. April 21, 2	2009-04-21
Method for Measuring Topographic Structures on Devices App 20080144006 - Stelzl; Michael ; et al.	2008-06-19
Standard for referencing luminescence signals App 20060202118 - Engel; Axel ; et al.	2006-09-14
Standard for referencing luminescence signals App 20060199018 - Engel; Axel ; et al.	2006-09-07

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