Stellari; Franco

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stellari; Franco.The latest application filed is for "machine learning-based circuit board inspection".

Company Profile

23.68.71

Stellari; Franco - Waldwick NJ
Stellari; Franco - Yorktown Heights NY
Stellari; Franco - Ho Ho Kus NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Machine Learning-based Circuit Board Inspection App 20220301134 - Stellari; Franco ; et al.	2022-09-22
Creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system Grant 11,307,250 - Stellari , et al. April 19, 2	2022-04-19
Imaging integrated circuits using a single-point single-photon detector and a scanning system and calculating of a per-pixel value Grant 11,287,630 - Stellari , et al. March 29, 2	2022-03-29
Method for the characterization and monitoring of integrated circuits Grant 11,169,200 - Robertazzi , et al. November 9, 2	2021-11-09
Detection of performance degradation in integrated circuits Grant 11,105,856 - Ray , et al. August 31, 2	2021-08-31
Integrated circuit identification Grant 11,106,764 - Shehata , et al. August 31, 2	2021-08-31
Method for the characterization and monitoring of integrated circuits Grant 11,061,063 - Robertazzi , et al. July 13, 2	2021-07-13
Integrated circuit identification Grant 11,036,832 - Shehata , et al. June 15, 2	2021-06-15
Creating Time-resolved Emission Images Of Integrated Circuits Using A Single-point Single-photon Detector And A Scanning System App 20210063481 - Stellari; Franco ; et al.	2021-03-04
Imaging Integrated Circuits Using A Single-point Single-photon Detector And A Scanning System And Calculating Of A Per-pixel Value App 20210063716 - Stellari; Franco ; et al.	2021-03-04
Scanning Methods For Creating Time-resolved Emission Images Of Integrated Circuits Using A Single-point Single-photon Detector And A Scanning System App 20210063482 - Stellari; Franco ; et al.	2021-03-04
Automated scan chain diagnostics using emission Grant 10,928,448 - Stellari , et al. February 23, 2	2021-02-23
Method and system for quickly identifying circuit components in an emission image Grant 10,895,596 - Song , et al. January 19, 2	2021-01-19
Integrated circuit defect detection using pattern images Grant 10,755,404 - Lin , et al. A	2020-08-25
Automated focusing of a microscope of an optical inspection system Grant 10,755,397 - Stellari , et al. A	2020-08-25
Detection Of Performance Degradation In Integrated Circuits App 20200150181 - Ray; Emily A. ; et al.	2020-05-14
Detection Of An Aged Circuit App 20200132751 - Stellari; Franco ; et al.	2020-04-30
Automated Scan Chain Diagnostics Using Emission App 20200088791 - STELLARI; FRANCO ; et al.	2020-03-19
Automated scan chain diagnostics using emission Grant 10,591,539 - Stellari , et al.	2020-03-17
Using Photonic Emission To Develop Electromagnetic Emission Models App 20200082518 - Bahgat Shehata; Andrea ; et al.	2020-03-12
Integrated Circuit Identification And Reverse Engineering App 20200082054 - Shehata; Andrea Bahgat ; et al.	2020-03-12
Integrated Circuit Identification And Reverse Engineering App 20200082053 - Shehata; Andrea Bahgat ; et al.	2020-03-12
Ring oscillator structures to determine local voltage value Grant 10,574,240 - Jenkins , et al. Feb	2020-02-25
Scan chain latch design that improves testability of integrated circuits Grant 10,571,520 - Maliuk , et al. Feb	2020-02-25
Dielectric breakdown monitor Grant 10,564,213 - Huynh , et al. Feb	2020-02-18
Non-destructive analysis to determine use history of processor Grant 10,552,278 - Jenkins , et al. Fe	2020-02-04
Integrated circuit identification Grant 10,515,183 - Shehata , et al. Dec	2019-12-24
Integrated circuit identification Grant 10,515,181 - Shehata , et al. Dec	2019-12-24
Method For The Characterization And Monitoring Of Integrated Circuits App 20190353695 - Robertazzi; Raphael P. ; et al.	2019-11-21
Automated Focusing Of A Microscope Of An Optical Inspection System App 20190325568 - Stellari; Franco ; et al.	2019-10-24
Method for the characterization and monitoring of integrated circuits Grant 10,429,433 - Robertazzi , et al. October 1, 2	2019-10-01
Method For The Characterization And Monitoring Of Integrated Circuits App 20190285690 - Robertazzi; Raphael P. ; et al.	2019-09-19
Non-destructive determination of components of integrated circuits Grant 10,386,409 - Gignac , et al. A	2019-08-20
Method for the characterization and monitoring of integrated circuits Grant 10,379,152 - Robertazzi , et al. A	2019-08-13
Automated Scan Chain Diagnostics Using Emission App 20190212388 - STELLARI; FRANCO ; et al.	2019-07-11
Integrated Circuit Defect Detection Using Pattern Images App 20190180430 - Lin; Chung-Ching ; et al.	2019-06-13
Automated scan chain diagnostics using emission Grant 10,302,697 - Stellari , et al.	2019-05-28
Detection of hardware trojan using light emissions with sacrificial mask Grant 10,147,175 - Bahgat Shehata , et al. De	2018-12-04
Integrated Circuit Identification And Reverse Engineering App 20180330037 - Shehata; Andrea Bahgat ; et al.	2018-11-15
Integrated Circuit Identification And Reverse Engineering App 20180330038 - Shehata; Andrea Bahgat ; et al.	2018-11-15
Non-destructive Analysis To Determine Use History Of Processor App 20180322025 - Jenkins; Keith A. ; et al.	2018-11-08
Non-destructive analysis to determine use history of processor Grant 10,102,090 - Jenkins , et al. October 16, 2	2018-10-16
Ring Oscillator Structures To Determine Local Voltage Value App 20180248555 - Jenkins; Keith A. ; et al.	2018-08-30
Dielectric Breakdown Monitor App 20180246159 - Huynh; Tam N. ; et al.	2018-08-30
Detection Of Hardware Trojan Using Light Emissions With Sacrificial Mask App 20180211377 - Bahgat Shehata; Andrea ; et al.	2018-07-26
Integrated Circuit Temperature Determination Using Photon Emission Detection App 20180100891 - Stellari; Franco ; et al.	2018-04-12
Integrated time dependent dielectric breakdown reliability testing Grant 9,939,486 - Chen , et al. April 10, 2	2018-04-10
Minimum-spacing circuit design and layout for PICA Grant 9,930,325 - Ainspan , et al. March 27, 2	2018-03-27
Integrated time dependent dielectric breakdown reliability testing Grant 9,874,601 - Chen , et al. January 23, 2	2018-01-23
Dynamic real-time layout overlay Grant 9,830,702 - Stellari November 28, 2	2017-11-28
Non-destructive Analysis To Determine Use History Of Processor App 20170329685 - Jenkins; Keith A. ; et al.	2017-11-16
Scan chain latch design that improves testability of integrated circuits Grant 9,678,152 - Maliuk , et al. June 13, 2	2017-06-13
Automated Scan Chain Diagnostics Using Emission App 20170147736 - STELLARI; FRANCO ; et al.	2017-05-25
Method And System For Quickly Identifying Circuit Components In An Emission Image App 20170131350 - SONG; PEILIN ; et al.	2017-05-11
Integrated Time Dependent Dielectric Breakdown Reliability Testing App 20170122999 - Chen; Jifeng ; et al.	2017-05-04
Dynamic Real-time Layout Overlay App 20170116722 - STELLARI; FRANCO	2017-04-27
Precise estimation of arrival time of switching events close in time and space Grant 9,632,136 - Stellari April 25, 2	2017-04-25
Scan Chain Latch Design That Improves Testability Of Integrated Circuits App 20170097389 - Maliuk; Dzmitry S. ; et al.	2017-04-06
Non-destructive Determination Of Components Of Integrated Circuits App 20170074927 - Gignac; Lynne M. ; et al.	2017-03-16
Method For The Characterization And Monitoring Of Integrated Circuits App 20170067958 - Robertazzi; Raphael P. ; et al.	2017-03-09
Method and system for quickly identifying circuit components in an emission image Grant 9,581,642 - Song , et al. February 28, 2	2017-02-28
Method for the characterization and monitoring of integrated circuits Grant 9,568,540 - Robertazzi , et al. February 14, 2	2017-02-14
Integrated time dependent dielectric breakdown reliability testing Grant 9,557,369 - Chen , et al. January 31, 2	2017-01-31
Integrated Time Dependent Dielectric Breakdown Reliability Testing App 20170010322 - Chen; Jifeng ; et al.	2017-01-12
Integrated time dependent dielectric breakdown reliability testing Grant 9,448,277 - Chen , et al. September 20, 2	2016-09-20
Method For The Characterization And Monitoring Of Integrated Circuits App 20160223606 - Robertazzi; Raphael P. ; et al.	2016-08-04
Scan chain latch design that improves testability of integrated circuits Grant 9,372,231 - Maliuk , et al. June 21, 2	2016-06-21
Minimum-spacing Circuit Design And Layout For Pica App 20160150227 - AINSPAN; HERSCHEL A. ; et al.	2016-05-26
Scan Chain Latch Design That Improves Testability Of Integrated Circuits App 20160116534 - Maliuk; Dzmitry S. ; et al.	2016-04-28
Scan chain latch design that improves testability of integrated circuits Grant 9,261,561 - Maliuk , et al. February 16, 2	2016-02-16
Scan Chain Latch Design That Improves Testability Of Integrated Circuits App 20160003902 - Maliuk; Dzmitry S. ; et al.	2016-01-07
Minimum-spacing circuit design and layout for PICA Grant 9,229,044 - Ainspan , et al. January 5, 2	2016-01-05
Method For The Characterization And Monitoring Of Integrated Circuits App 20150247892 - Robertazzi; Raphael P. ; et al.	2015-09-03
Minimum-spacing circuit design and layout for PICA Grant 9,081,049 - Ainspan , et al. July 14, 2	2015-07-14
Detecting chip alterations with light emission Grant 9,075,106 - Bernstein , et al. July 7, 2	2015-07-07
Precise Estimation Of Arrival Time Of Switching Events Close In Time And Space App 20140303917 - Stellari; Franco	2014-10-09
Scan Chain Latch Design That Improves Testability Of Integrated Circuits App 20140298128 - Maliuk; Dzmitry ; et al.	2014-10-02
Integrated Time Dependent Dielectric Breakdown Reliability Testing App 20140207396 - Chen; Jifeng ; et al.	2014-07-24
Minimum-spacing Circuit Design And Layout For Pica App 20140176183 - Ainspan; Herschel A. ; et al.	2014-06-26
Registering measured images to layout data Grant 8,750,595 - Stellari June 10, 2	2014-06-10
Navigating analytical tools using layout software Grant 8,635,582 - Stellari , et al. January 21, 2	2014-01-21
Integrated Time Dependent Dielectric Breakdown Reliability Testing App 20130345997 - CHEN; JIFENG ; et al.	2013-12-26
Minimum-spacing Circuit Design And Layout For Pica App 20130280828 - AINSPAN; HERSCHEL A. ; et al.	2013-10-24
Minimum-spacing Circuit Design And Layout For Pica App 20130278285 - AINSPAN; HERSCHEL A. ; et al.	2013-10-24
Self-adjusting critical path timing of multi-core VLSI chip Grant 8,412,993 - Song , et al. April 2, 2	2013-04-02
Navigating Analytical Tools Using Layout Software App 20130061199 - Stellari; Franco ; et al.	2013-03-07
Creating emission images of integrated circuits Grant 8,331,726 - Stellari , et al. December 11, 2	2012-12-11
Navigating analytical tools using layout software Grant 8,312,413 - Stellari , et al. November 13, 2	2012-11-13
Apparatus and methods for packaging electronic devices for optical testing Grant 8,193,009 - Tosi , et al. June 5, 2	2012-06-05
Registering Measured Images To Layout Data App 20120087568 - STELLARI; FRANCO	2012-04-12
Constructing variability maps by correlating off-state leakage emission images to layout information Grant 8,131,056 - Polonsky , et al. March 6, 2	2012-03-06
Method and apparatus for creating time-resolved emission images of integrated circuits using a single-point single-photon detector and a scanning system Grant 8,115,170 - Stellari , et al. February 14, 2	2012-02-14
Self-Adjusting Critical Path Timing of Multi-Core VLSI Chip App 20110296266 - Song; Peilin ; et al.	2011-12-01
Method And System For Quickly Identifying Circuit Components In An Emission Image App 20110280468 - Song; Peilin ; et al.	2011-11-17
System and method for virtual control of laboratory equipment Grant 8,041,437 - Stellari , et al. October 18, 2	2011-10-18
Navigating Analytical Tools Using Layout Software App 20110185325 - Stellari; Franco ; et al.	2011-07-28
Apparatus and methods for packaging electronic devices for optical testing Grant 7,927,898 - Tosi , et al. April 19, 2	2011-04-19
Detecting Chip Alterations with Light Emission App 20110026806 - Bernstein; Kerry ; et al.	2011-02-03
Process variation on-chip sensor Grant 7,868,606 - Meterelliyoz , et al. January 11, 2	2011-01-11
Creating Emission Images Of Integrated Circuits App 20100329586 - Stellari; Franco ; et al.	2010-12-30
Method and apparatus for diagnosing broken scan chain based on leakage light emission Grant 7,788,058 - Song , et al. August 31, 2	2010-08-31
Constructing Variability Maps by Correlating Off-State Leakage Emission Images to Layout Information App 20100080445 - Polonsky; Stanislav ; et al.	2010-04-01
System and Method for Automatic Instrument Address Recognition App 20100050104 - Stellari; Franco	2010-02-25
Apparatus and methods for packaging electronic devices for optical testing Grant 7,635,904 - Tosi , et al. December 22, 2	2009-12-22
Apparatus and Methods for Packaging Electronic Devices for Optical Testing App 20090286353 - Tosi; Alberto ; et al.	2009-11-19
Apparatus and Methods for Packaging Electronic Devices for Optical Testing App 20090284736 - Tosi; Alberto ; et al.	2009-11-19
System and method for estimation of integrated circuit signal characteristics using optical measurements Grant 7,612,571 - Stellari , et al. November 3, 2	2009-11-03
System and Method for Virtual Control of Laboratory Equipment App 20090259321 - Stellari; Franco ; et al.	2009-10-15
Process variation on-chip sensor App 20090206821 - Meterelliyoz; Mesut ; et al.	2009-08-20
Measuring and predicting VLSI chip reliability and failure Grant 7,480,882 - Song , et al. January 20, 2	2009-01-20
Enhanced signal observability for circuit analysis Grant 7,446,550 - McDowell , et al. November 4, 2	2008-11-04
Method and apparatus for diagnosing broken scan chain based on leakage light emission Grant 7,426,448 - Song , et al. September 16, 2	2008-09-16
Method And Apparatus For Diagnosing Broken Scan Chain Based On Leakage Light Emission App 20080208507 - SONG; PEILIN ; et al.	2008-08-28
System And Method For Estimation Of Integrated Circuit Signal Characteristics Using Optical Measurements App 20080204057 - Stellari; Franco ; et al.	2008-08-28
Method And Apparatus For Creating Time-resolved Emission Images Of Integrated Circuits Using A Single-point Single-photon Detector And A Scanning System App 20080164414 - STELLARI; FRANCO ; et al.	2008-07-10
System and method for estimation of integrated circuit signal characteristics using optical measurements Grant 7,378,859 - Stellari , et al. May 27, 2	2008-05-27
Enhanced signal observability for circuit analysis Grant 7,355,419 - McDowell , et al. April 8, 2	2008-04-08
Enhanced Signal Observability For Circuit Analysis App 20080079448 - McDowell; Chandler Todd ; et al.	2008-04-03
Optical trigger for PICA technique Grant 7,239,157 - Stellari , et al. July 3, 2	2007-07-03
Method and apparatus for light-controlled circuit characterization Grant 7,154,287 - Song , et al. December 26, 2	2006-12-26
Optical trigger for PICA technique App 20060220664 - Stellari; Franco ; et al.	2006-10-05
Apparatus and methods for packaging electronic devices for optical testing App 20060208753 - Tosi; Alberto ; et al.	2006-09-21
System and method for estimation of integrated circuit signal characteristics using optical measurements App 20060168793 - Stellari; Franco ; et al.	2006-08-03
Method and apparatus for light-controlled circuit characterization App 20060164113 - Song; Peilin ; et al.	2006-07-27
Enhanced signal observability for circuit analysis App 20060028219 - McDowell; Chandler Todd ; et al.	2006-02-09
Method and apparatus for diagnosing broken scan chain based on leakage light emission App 20050168228 - Song, Peilin ; et al.	2005-08-04

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