STEJSKAL; Pavel
Patent Applications and Registrations
Patent applications and USPTO patent grants for STEJSKAL; Pavel.The latest application filed is for "methods and apparatus for electron backscatter diffraction sample characterisation".
- STEJSKAL; Pavel - Brno CZ
- Stejskal; Pavel - Dolni Dobrouc CZ
| Patent | Date |
|---|---|
| Methods And Apparatus For Electron Backscatter Diffraction Sample Characterisation App 20220136985 - DAY; Austin Penrose ; et al. | 2022-05-05 |
| Recording Of Trash In A Fiber Preparation System App 20220042213 - Wolfer; Tobias ; et al. | 2022-02-10 |
| Method and system for dynamic band contrast imaging Grant 11,195,693 - December 7, 2 | 2021-12-07 |
| Method And System For Dynamic Band Contrast Imaging App 20210375582 - Vystav l; Tomas ; et al. | 2021-12-02 |
| Charged Particle Beam Device For Inspection Of A Specimen With A Plurality Of Charged Particle Beamlets App 20210296088 - Stejskal; Pavel ; et al. | 2021-09-23 |
| Methods and systems for acquiring electron backscatter diffraction patterns Grant 11,114,275 - Stejskal , et al. September 7, 2 | 2021-09-07 |
| Measurement and endpointing of sample thickness Grant 10,978,272 - Vystavel , et al. April 13, 2 | 2021-04-13 |
| Multi-beam electron microscope Grant 10,937,627 - Stejskal , et al. March 2, 2 | 2021-03-02 |
| Methods And Systems For Acquiring Electron Backscatter Diffraction Patterns App 20210005420 - Stejskal; Pavel ; et al. | 2021-01-07 |
| Measurement And Endpointing Of Sample Thickness App 20200135427 - Vystavel; Tomas ; et al. | 2020-04-30 |
| Multi-beam Electron Microscope App 20190378681 - Stejskal; Pavel ; et al. | 2019-12-12 |
| Arrangement for X-Ray tomography Grant 9,958,403 - Stejskal , et al. May 1, 2 | 2018-05-01 |
| Arrangement For X-ray Tomography App 20180100815 - Stejskal; Pavel ; et al. | 2018-04-12 |
| Method of acquiring EBSP patterns Grant 9,618,463 - April 11, 2 | 2017-04-11 |
| Method Of Acquiring Ebsp Patterns App 20160054240 - Uncovsk ; Marek ; et al. | 2016-02-25 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 