Steinhauer; David E.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Steinhauer; David E..The latest application filed is for "system and method for detecting poor quality in 3d reconstructions".
- Steinhauer; David E. - Lynnwood WA
- Steinhauer; David E. - Brier WA
- Steinhauer; David E. - Laurel MD
| Patent | Date |
|---|---|
| Pattern noise correction for pseudo projections Grant 8,090,183 - Meyer , et al. January 3, 2 | 2012-01-03 |
| System and Method for Detecting Poor Quality in 3D Reconstructions App 20100296713 - Meyer; Michael G. ; et al. | 2010-11-25 |
| Pattern Noise Correction For Pseudo Projections App 20100232664 - Meyer; Michael G. ; et al. | 2010-09-16 |
| Quantitative imaging of dielectric permittivity and tunability Grant 6,809,533 - Anlage , et al. October 26, 2 | 2004-10-26 |
| Near-field scanning microwave microscope having a transmission line with an open end Grant 5,900,618 - Anlage , et al. May 4, 1 | 1999-05-04 |
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