Steigmeier; Edgar F.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Steigmeier; Edgar F..The latest application filed is for "apparatus for surface inspection".
- Steigmeier; Edgar F. - Hedingen CH
- Steigmeier; Edgar F. - Schweiz DE
| Patent | Date |
|---|---|
| Apparatus for surface inspections Grant 5,377,002 - Malin , et al. December 27, 1 | 1994-12-27 |
| Apparatus for surface inspection Grant 5,377,001 - Malin , et al. December 27, 1 | 1994-12-27 |
| Apparatus and method for detecting defects and dust on a patterned surface Grant 4,598,997 - Steigmeier , et al. July 8, 1 | 1986-07-08 |
| Method for determining the phase of phase transformable light scattering material Grant 4,526,468 - Steigmeier , et al. July 2, 1 | 1985-07-02 |
| Method for determining the quality of light scattering material Grant 4,391,524 - Steigmeier , et al. July 5, 1 | 1983-07-05 |
| Defect detection system Grant 4,314,763 - Steigmeier , et al. February 9, 1 | 1982-02-09 |
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