Stegmann; Heiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stegmann; Heiko.The latest application filed is for "method for processing an object".

Company Profile

2.4.8

Stegmann; Heiko - Dresden DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam system and method Grant 10,854,421 - Donhauser , et al. December 1, 2	2020-12-01
Method for processing an object Grant 10,796,881 - Stegmann October 6, 2	2020-10-06
Method For Processing An Object App 20200066483 - Stegmann; Heiko	2020-02-27
Charged Particle Beam System And Method App 20190304743 - Donhauser; Daniela ; et al.	2019-10-03
Methods and apparatus for the preparation of microscopy samples by using pulsed light Grant 9,816,946 - Stegmann November 14, 2	2017-11-14
Method For Setting An Operating Parameter Of A Particle Beam Device And A Sample Holder For Performing The Method App 20130234011 - Niebel; Harald ; et al.	2013-09-12
Methods and Apparatus for the Preparation of Microscopy Samples by Using Pulsed Light App 20130213945 - Stegmann; Heiko	2013-08-22
Method for setting an operating parameter of a particle beam device and a sample holder for performing the method App 20100230584 - Niebel; Harald ; et al.	2010-09-16
Method for objective and accurate thickness measurement of thin films on a microscopic scale App 20030222215 - de Robillard, Quentin ; et al.	2003-12-04

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