Patent | Date |
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Method and apparatus for controlling the spatial temperature distribution across the surface of a workpiece support Grant 8,921,740 - Benjamin , et al. December 30, 2 | 2014-12-30 |
Substrate support having dynamic temperature control Grant 8,747,559 - Steger June 10, 2 | 2014-06-10 |
Method And Apparatus For Controlling The Spatial Temperature Distribution Across The Surface Of A Workpiece Support App 20140034608 - Benjamin; Neil ;   et al. | 2014-02-06 |
Substrate Support Having Dynamic Temperature Control App 20110262315 - Steger; Robert J. | 2011-10-27 |
Substrate support having dynamic temperature control Grant 7,993,460 - Steger August 9, 2 | 2011-08-09 |
Electrostatic chuck having radial temperature control capability Grant 7,718,932 - Steger May 18, 2 | 2010-05-18 |
Cleaning of electrostatic chucks using ultrasonic agitation and applied electric fields Grant 7,648,582 - Steger January 19, 2 | 2010-01-19 |
Methods Of Making Gas Distribution Members For Plasma Processing Apparatuses App 20090120583 - Steger; Robert J. | 2009-05-14 |
Methods of making gas distribution members for plasma processing apparatuses Grant 7,480,974 - Steger January 27, 2 | 2009-01-27 |
Switched uniformity control Grant 7,282,454 - Gottscho , et al. October 16, 2 | 2007-10-16 |
Faraday Shield Disposed Within An Inductively Coupled Plasma Etching apparatus App 20070181257 - Comendant; Keith ;   et al. | 2007-08-09 |
Cleaning of electrostatic chucks using ultrasonic agitation and applied electric fields App 20070144554 - Steger; Robert J. | 2007-06-28 |
Faraday shield disposed within an inductively coupled plasma etching apparatus Grant 7,223,321 - Comendant , et al. May 29, 2 | 2007-05-29 |
Electrostatic Chuck Having Radial Temperature Control Capability App 20070086144 - Steger; Robert J. | 2007-04-19 |
Method and apparatus for the compensation of edge ring wear in a plasma processing chamber Grant 7,176,403 - Steger February 13, 2 | 2007-02-13 |
Electrostatic Chuck Having Radial Temperature Control Capability App 20070007276 - Steger; Robert J. | 2007-01-11 |
Electrostatic chuck having radial temperature control capability Grant 7,161,121 - Steger January 9, 2 | 2007-01-09 |
Methods of making gas distribution members for plasma processing apparatuses App 20060180275 - Steger; Robert J. | 2006-08-17 |
Methods and apparatus for in situ substrate temperature monitoring Grant 6,976,782 - Steger December 20, 2 | 2005-12-20 |
Method and apparatus for the compensation of edge ring wear in a plasma processing chamber Grant 6,896,765 - Steger May 24, 2 | 2005-05-24 |
Method and apparatus for the compensation of edge ring wear in a plasma processing chamber App 20050056622 - Steger, Robert J. | 2005-03-17 |
Method for balancing return currents in plasma processing apparatus App 20050022736 - Steger, Robert J. | 2005-02-03 |
Substrate support having dynamic temperature control App 20040261721 - Steger, Robert J. | 2004-12-30 |
Low contamination plasma chamber components and methods for making the same App 20040224128 - Chang, Christopher C. ;   et al. | 2004-11-11 |
Low contamination plasma chamber components and methods for making the same Grant 6,805,952 - Chang , et al. October 19, 2 | 2004-10-19 |
Electrostatic chuck having dielectric member with stacked layers and manufacture App 20040190215 - Weldon, Edwin C. ;   et al. | 2004-09-30 |
Critical dimension variation compensation across a wafer by means of local wafer temperature control Grant 6,770,852 - Steger August 3, 2 | 2004-08-03 |
Electrostatic chuck having composite dielectric layer and method of manufacture Grant 6,721,162 - Weldon , et al. April 13, 2 | 2004-04-13 |
Method and apparatus for the compensation of edge ring wear in a plasma processing chamber App 20040053428 - Steger, Robert J. | 2004-03-18 |
Switched uniformity control App 20040031564 - Gottscho, Richard A. ;   et al. | 2004-02-19 |
Switched uniformity control Grant 6,632,322 - Gottscho , et al. October 14, 2 | 2003-10-14 |
Electrostatic chuck having composite dielectric layer and method of manufacture App 20020135969 - Weldon, Edwin C. ;   et al. | 2002-09-26 |
Low contamination plasma chamber components and methods for making the same App 20020086118 - Chang, Christopher C. ;   et al. | 2002-07-04 |
Symmetric tunable inductively coupled HDP-CVD reactor Grant 6,170,428 - Redeker , et al. January 9, 2 | 2001-01-09 |
Electrostatic chuck having improved gas conduits Grant 6,108,189 - Weldon , et al. August 22, 2 | 2000-08-22 |
Conduits for flow of heat transfer fluid to the surface of an electrostatic chuck Grant 5,904,776 - Donde , et al. May 18, 1 | 1999-05-18 |
Apparatus and method for cleaning of semiconductor process chamber surfaces Grant 5,788,799 - Steger , et al. August 4, 1 | 1998-08-04 |
Conduits for flow of heat transfer fluid to the surface of an electrostatic chuck Grant 5,720,818 - Donde , et al. February 24, 1 | 1998-02-24 |
Method and structure for improving gas breakdown resistance and reducing the potential of arcing in an electrostatic chuck Grant 5,715,132 - Steger , et al. February 3, 1 | 1998-02-03 |
Method for supporting a wafer in a combined wafer support and temperature monitoring device Grant 5,567,909 - Sugarman , et al. October 22, 1 | 1996-10-22 |
Electrostatic chuck having a grooved surface Grant 5,522,131 - Steger June 4, 1 | 1996-06-04 |
Controlling plasma particulates by contouring the plasma sheath using materials of differing RF impedances Grant 5,494,523 - Steger , et al. February 27, 1 | 1996-02-27 |
Combined wafer support and temperature monitoring device Grant 5,356,486 - Sugarman , et al. October 18, 1 | 1994-10-18 |
Uniformity for magnetically enhanced plasma chambers Grant 5,308,417 - Groechel , et al. May 3, 1 | 1994-05-03 |
Plasma etching apparatus with conductive means for inhibiting arcing Grant 5,292,399 - Lee , et al. March 8, 1 | 1994-03-08 |
Method of forming plasma etch apparatus with conductive coating on inner metal surfaces of chamber to provide protection from chemical corrosion Grant 5,268,200 - Steger December 7, 1 | 1993-12-07 |
Semiconductor wafer transfer in processing systems Grant 5,100,502 - Murdoch , et al. March 31, 1 | 1992-03-31 |
Plasma etch apparatus with conductive coating on inner metal surfaces of chamber to provide protection from chemical corrosion Grant 5,085,727 - Steger February 4, 1 | 1992-02-04 |