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Patent applications and USPTO patent grants for Stefanski; Glenn M..The latest application filed is for "defect detection process in a semiconductor manufacturing environment".
Patent | Date |
---|---|
Defect detection process in a semiconductor manufacturing environment Grant 9,791,849 - Cutilli , et al. October 17, 2 | 2017-10-17 |
Defect Detection Process In A Semiconductor Manufacturing Environment App 20160349735 - Cutilli; David F. ;   et al. | 2016-12-01 |
System and method for safeguarding wafers and photomasks Grant 8,749,388 - Hand , et al. June 10, 2 | 2014-06-10 |
System And Method For Safeguarding Wafers And Photomasks App 20130038451 - Hand; Paul D. ;   et al. | 2013-02-14 |
System and method for safeguarding wafers and photomasks Grant 8,299,926 - Hand , et al. October 30, 2 | 2012-10-30 |
System And Method For Safeguarding Wafers And Photomasks App 20100289645 - Hand; Paul D. ;   et al. | 2010-11-18 |
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