Stathis; James H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stathis; James H..The latest application filed is for "accelerated wafer testing using non-destructive and localized stress".

Company Profile

2.10.8

Stathis; James H. - Poughquag NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Accelerated wafer testing using non-destructive and localized stress Grant 10,746,782 - Briggs , et al. A	2020-08-18
Accelerated wafer testing using non-destructive and localized stress Grant 10,739,397 - Briggs , et al. A	2020-08-11
Ring oscillator structures to determine local voltage value Grant 10,574,240 - Jenkins , et al. Feb	2020-02-25
Non-destructive analysis to determine use history of processor Grant 10,552,278 - Jenkins , et al. Fe	2020-02-04
Accelerated Wafer Testing Using Non-destructive And Localized Stress App 20180328977 - Briggs; Benjamin D. ; et al.	2018-11-15
Accelerated Wafer Testing Using Non-destructive And Localized Stress App 20180328979 - Briggs; Benjamin D. ; et al.	2018-11-15
Non-destructive Analysis To Determine Use History Of Processor App 20180322025 - Jenkins; Keith A. ; et al.	2018-11-08
Non-destructive analysis to determine use history of processor Grant 10,102,090 - Jenkins , et al. October 16, 2	2018-10-16
Test structures for dielectric reliability evaluations Grant 10,103,060 - Brochu, Jr. , et al. October 16, 2	2018-10-16
Ring Oscillator Structures To Determine Local Voltage Value App 20180248555 - Jenkins; Keith A. ; et al.	2018-08-30
Non-destructive Analysis To Determine Use History Of Processor App 20170329685 - Jenkins; Keith A. ; et al.	2017-11-16
Test Structures For Dielectric Reliability Evaluations App 20160372389 - Brochu, JR.; David G. ; et al.	2016-12-22
Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations Grant 9,287,185 - Bonilla , et al. March 15, 2	2016-03-15
Dielectric reliability assessment for advanced semiconductors Grant 9,026,981 - Li , et al. May 5, 2	2015-05-05
Dielectric Reliability Assessment For Advanced Semiconductors App 20140351785 - LI; BAOZHEN ; et al.	2014-11-27
Dielectric reliability assessment for advanced semiconductors Grant 8,839,180 - Li , et al. September 16, 2	2014-09-16
Method for non-contact stress evaluation of wafer gate dielectric reliability Grant 6,602,772 - Abadeer , et al. August 5, 2	2003-08-05
Method for non-contact stress evaluation of wafer gate dielectric reliability App 20020070675 - Abadeer, Wagdi W. ; et al.	2002-06-13

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