Patent | Date |
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Structure And Method To Improve Fav Rie Process Margin And Electromigration App 20210210380 - Briggs; Benjamin David ;   et al. | 2021-07-08 |
Structure and method to improve FAV RIE process margin and Electromigration Grant 10,985,056 - Briggs , et al. April 20, 2 | 2021-04-20 |
Structure and method to improve FAV RIE process margin and electromigration Grant 10,957,584 - Briggs , et al. March 23, 2 | 2021-03-23 |
Structure and method for improved stabilization of cobalt cap and/or cobalt liner in interconnects Grant 10,134,674 - Briggs , et al. November 20, 2 | 2018-11-20 |
Structure And Method To Improve Fav Rie Process Margin And Electromigration App 20180122691 - Briggs; Benjamin David ;   et al. | 2018-05-03 |
Structure And Method To Improve Fav Rie Process Margin And Electromigration App 20180122692 - Briggs; Benjamin David ;   et al. | 2018-05-03 |
Structure And Method To Improve Fav Rie Process Margin And Electromigration App 20180114723 - Briggs; Benjamin David ;   et al. | 2018-04-26 |
Structure and method to improve FAV RIE process margin and electromigration Grant 9,953,865 - Briggs , et al. April 24, 2 | 2018-04-24 |
Structure And Method For Improved Stabilization Of Cobalt Cap And/or Cobalt Liner In Interconnects App 20180005953 - Briggs; Benjamin D. ;   et al. | 2018-01-04 |
Structure and method for improved stabilization of cobalt cap and/or cobalt liner in interconnects Grant 9,780,035 - Briggs , et al. October 3, 2 | 2017-10-03 |
Method and structure to reduce the electric field in semiconductor wiring interconnects Grant 9,666,529 - Huang , et al. May 30, 2 | 2017-05-30 |
Self-aligned dielectric isolation for FinFET devices Grant 9,627,377 - Bergendahl , et al. April 18, 2 | 2017-04-18 |
FinFET with dielectric isolation by silicon-on-nothing and method of fabrication Grant 9,478,549 - Cheng , et al. October 25, 2 | 2016-10-25 |
Method and structure to reduce the electric field in semiconductor wiring interconnects Grant 9,379,057 - Huang , et al. June 28, 2 | 2016-06-28 |
Semiconductor structure with deep trench thermal conduction Grant 9,349,838 - Cheng , et al. May 24, 2 | 2016-05-24 |
Semiconductor structure with deep trench thermal conduction Grant 9,331,177 - Cheng , et al. May 3, 2 | 2016-05-03 |
Method And Structure To Reduce The Electric Field In Semiconductor Wiring Interconnects App 20160064321 - Huang; Elbert Emin ;   et al. | 2016-03-03 |
Method And Structure To Reduce The Electric Field In Semiconductor Wiring Interconnects App 20160064330 - Huang; Elbert Emin ;   et al. | 2016-03-03 |
Dummy fin formation by gas cluster ion beam Grant 9,269,629 - Cheng , et al. February 23, 2 | 2016-02-23 |
Semiconductor structure with deep trench thermal conduction Grant 9,252,242 - Standaert , et al. February 2, 2 | 2016-02-02 |
FinFET with dielectric isolation by silicon-on-nothing and method of fabrication Grant 9,219,068 - Cheng , et al. December 22, 2 | 2015-12-22 |
Finfet With Dielectric Isolation By Silicon-on-nothing And Method Of Fabrication App 20150340288 - Cheng; Kangguo ;   et al. | 2015-11-26 |
Method and structure for finFET with finely controlled device width Grant 9,082,873 - Yamashita , et al. July 14, 2 | 2015-07-14 |
FinFET with dielectric isolation by silicon-on-nothing and method of fabrication Grant 9,000,522 - Cheng , et al. April 7, 2 | 2015-04-07 |
Dummy Fin Formation By Gas Cluster Ion Beam App 20150064874 - Cheng; Kangguo ;   et al. | 2015-03-05 |
Finfet With Dielectric Isolation By Silicon-on-nothing And Method Of Fabrication App 20150064855 - Cheng; Kangguo ;   et al. | 2015-03-05 |
Self-aligned Dielectric Isolation For Finfet Devices App 20150061040 - Bergendahl; Marc Adam ;   et al. | 2015-03-05 |
Semiconductor Structure With Deep Trench Thermal Conduction App 20150054082 - Cheng; Kangguo ;   et al. | 2015-02-26 |
Dummy fin formation by gas cluster ion beam Grant 8,946,792 - Cheng , et al. February 3, 2 | 2015-02-03 |
Self-aligned dielectric isolation for FinFET devices Grant 8,941,156 - Bergendahl , et al. January 27, 2 | 2015-01-27 |
Semiconductor Structure With Deep Trench Thermal Conduction App 20140284717 - Standaert; Theodorus Eduardus ;   et al. | 2014-09-25 |
FinFET trench circuit Grant 8,835,250 - Faltermeier , et al. September 16, 2 | 2014-09-16 |
Self-aligned Dielectric Isolation For Finfet Devices App 20140191296 - Bergendahl; Marc Adam ;   et al. | 2014-07-10 |
Finfet With Dielectric Isolation By Silicon-on-nothing And Method Of Fabrication App 20140191321 - Cheng; Kangguo ;   et al. | 2014-07-10 |
Finfet Compatible Diode For Esd Protection App 20140191319 - Cheng; Kangguo ;   et al. | 2014-07-10 |
Replacement metal gate transistors using bi-layer hardmask Grant 8,748,252 - Leobandung , et al. June 10, 2 | 2014-06-10 |
Replacement Metal Gate Transistors Using Bi-layer Hardmask App 20140148003 - Leobandung; Effendi ;   et al. | 2014-05-29 |
Dummy Fin Formation By Gas Cluster Ion Beam App 20140145248 - Cheng; Kangguo ;   et al. | 2014-05-29 |
Method And Structure For Finfet With Finely Controlled Device Width App 20140077296 - Yamashita; Tenko ;   et al. | 2014-03-20 |
Finfet Trench Circuit App 20140070294 - Faltermeier; Jonathan E. ;   et al. | 2014-03-13 |
FinFET diode with increased junction area Grant 8,592,263 - Standaert , et al. November 26, 2 | 2013-11-26 |
Finfet Diode With Increased Junction Area App 20130285208 - Standaert; Theodorus Eduardus ;   et al. | 2013-10-31 |
FinFET with improved gate planarity Grant 8,569,125 - Standaert , et al. October 29, 2 | 2013-10-29 |
Method And Structure For Inline Electrical Fin Critical Dimension Measurement App 20130173214 - Yamashita; Tenko ;   et al. | 2013-07-04 |
Finfet With Improved Gate Planarity App 20130134513 - Standaert; Theodorus Eduardus ;   et al. | 2013-05-30 |
Capping of copper interconnect lines in integrated circuit devices Grant 8,298,948 - Bonilla , et al. October 30, 2 | 2012-10-30 |
CMOS devices with different metals in gate electrodes using spin on low-k material as hard mask Grant 7,943,453 - Kastenmeier , et al. May 17, 2 | 2011-05-17 |
Reliability of wide interconnects Grant 7,776,737 - Bonilla , et al. August 17, 2 | 2010-08-17 |
Reliability Of Wide Interconnects App 20100038790 - Bonilla; Griselda ;   et al. | 2010-02-18 |
Cmos Devices With Different Metals In Gate Electrodes Using Spin On Low-k Material As Hard Mask App 20090159991 - Kastenmeier; Bernd Ernst Eduard ;   et al. | 2009-06-25 |
Interconnect structure and process of making the same Grant 7,488,679 - Standaert , et al. February 10, 2 | 2009-02-10 |
Interconnect Structure And Process Of Making The Same App 20080026568 - Standaert; Theodorus Eduardus ;   et al. | 2008-01-31 |