loadpatents
Patent applications and USPTO patent grants for Stamper; Anthony Kendall.The latest application filed is for "gallium nitride (gan) power amplifiers (pa) with angled electrodes and 100 cmos and method for producing the same".
Patent | Date |
---|---|
Lamb acoustic wave resonator and filter with self-aligned cavity via Grant 10,784,833 - Campanella Pineda , et al. Sept | 2020-09-22 |
Gallium nitride (GaN) power amplifiers (PA) with angled electrodes and 100 CMOS and method for producing the same Grant 10,469,041 - Stamper , et al. No | 2019-11-05 |
Gallium Nitride (gan) Power Amplifiers (pa) With Angled Electrodes And 100 Cmos And Method For Producing The Same App 20190238105 - STAMPER; Anthony Kendall ;   et al. | 2019-08-01 |
Monolithic integration of MEMS and IC devices Grant 10,189,705 - Campanella Pineda , et al. Ja | 2019-01-29 |
Lamb Acoustic Wave Resonator And Filter With Self-aligned Cavity Via App 20180287587 - CAMPANELLA PINEDA; Humberto ;   et al. | 2018-10-04 |
Curvilinear wiring structure to reduce areas of high field density in an integrated circuit Grant 9,275,951 - Anderson , et al. March 1, 2 | 2016-03-01 |
Methods for controlling wafer curvature Grant 08918988 - | 2014-12-30 |
Methods for controlling wafer curvature Grant 8,918,988 - Fayaz , et al. December 30, 2 | 2014-12-30 |
Tapered Via And Mim Capacitor App 20140151851 - DUNN; JAMES STUART ;   et al. | 2014-06-05 |
Tapered via and MIM capacitor Grant 8,649,153 - Dunn , et al. February 11, 2 | 2014-02-11 |
Through substrate via including variable sidewall profile Grant 8,643,190 - Cooney, III , et al. February 4, 2 | 2014-02-04 |
Curvilinear Wiring Structure To Reduce Areas Of High Field Density In An Integrated Circuit App 20130307158 - Anderson; Felix Patrick ;   et al. | 2013-11-21 |
Curvilinear wiring structure to reduce areas of high field density in an integrated circuit Grant 8,530,970 - Anderson , et al. September 10, 2 | 2013-09-10 |
Through wafer vias and method of making same Grant 8,518,787 - Ding , et al. August 27, 2 | 2013-08-27 |
Double-sided integrated circuit chips Grant 8,471,306 - Bernstein , et al. June 25, 2 | 2013-06-25 |
Double-sided integrated circuit chips Grant 8,421,126 - Bernstein , et al. April 16, 2 | 2013-04-16 |
Through wafer vias and method of making same Grant 8,384,224 - Ding , et al. February 26, 2 | 2013-02-26 |
Methods And Structures For Controlling Wafer Curvature App 20120329265 - Fayaz; Mohammed Fazil ;   et al. | 2012-12-27 |
Through Wafer Vias And Method Of Making Same App 20120329219 - Ding; Hanyi ;   et al. | 2012-12-27 |
Through wafer vias and method of making same Grant 8,299,566 - Ding , et al. October 30, 2 | 2012-10-30 |
Methods and structures for controlling wafer curvature Grant 8,299,615 - Fayaz , et al. October 30, 2 | 2012-10-30 |
Fuse and pad stress relief Grant 8,137,791 - Anderson , et al. March 20, 2 | 2012-03-20 |
Double-sided Integrated Circuit Chips App 20110302542 - Bernstein; Kerry ;   et al. | 2011-12-08 |
By-product collecting processes for cleaning processes Grant 8,052,799 - Cooney, III , et al. November 8, 2 | 2011-11-08 |
Through wafer via and method of making same Grant 8,035,198 - Ding , et al. October 11, 2 | 2011-10-11 |
Double-sided Integrated Circuit Chips App 20110241082 - Bernstein; Kerry ;   et al. | 2011-10-06 |
Interconnect layers without electromigration Grant 8,026,606 - Luce , et al. September 27, 2 | 2011-09-27 |
Double-sided integrated circuit chips Grant 8,013,342 - Bernstein , et al. September 6, 2 | 2011-09-06 |
Double-sided integrated circuit chips Grant 7,989,312 - Bernstein , et al. August 2, 2 | 2011-08-02 |
Dual wired integrated circuit chips Grant 7,960,245 - Bernstein , et al. June 14, 2 | 2011-06-14 |
Through Substrate Annular Via Including Plug Filler App 20110129996 - Lindgren; Peter James ;   et al. | 2011-06-02 |
Dual wired integrated circuit chips Grant 7,939,914 - Bernstein , et al. May 10, 2 | 2011-05-10 |
Method of integration of a MIM capacitor with a lower plate of metal gate material formed on an STI region or a silicide region formed in or on the surface of a doped well with a high K dielectric material Grant 7,915,134 - Chinthakindi , et al. March 29, 2 | 2011-03-29 |
Through Substrate Via Including Variable Sidewall Profile App 20110068477 - Cooney, III; Edward Crandal ;   et al. | 2011-03-24 |
Methods And Structures For Controlling Wafer Curvature App 20110049723 - Fayaz; Mohammed Fazil ;   et al. | 2011-03-03 |
Through substrate annular via including plug filler Grant 7,898,063 - Lindgren , et al. March 1, 2 | 2011-03-01 |
Through substrate via including variable sidewall profile Grant 7,863,180 - Cooney, III , et al. January 4, 2 | 2011-01-04 |
Dual-sided chip attached modules Grant 7,863,734 - Bernstein , et al. January 4, 2 | 2011-01-04 |
Structures including integrated circuits for reducing electromigration effect Grant 7,861,204 - Stamper , et al. December 28, 2 | 2010-12-28 |
Low resistance and inductance backside through vias and methods of fabricating same Grant 7,851,923 - Erturk , et al. December 14, 2 | 2010-12-14 |
Post last wiring level inductor using patterned plate process Grant 7,763,954 - Chinthakindi , et al. July 27, 2 | 2010-07-27 |
Post last wiring level inductor using patterned plate process Grant 7,741,698 - Chinthakindi , et al. June 22, 2 | 2010-06-22 |
Post last wiring level inductor using patterned plate process Grant 7,732,295 - Chinthakindi , et al. June 8, 2 | 2010-06-08 |
Post last wiring level inductor using patterned plate process Grant 7,732,294 - Chinthakindi , et al. June 8, 2 | 2010-06-08 |
Shallow and deep trench isolation structures in semiconductor integrated circuits Grant 7,723,178 - Adkisson , et al. May 25, 2 | 2010-05-25 |
Double-sided integrated circuit chips Grant 7,670,927 - Bernstein , et al. March 2, 2 | 2010-03-02 |
Double-sided Integrated Circuit Chips App 20100044759 - Bernstein; Kerry ;   et al. | 2010-02-25 |
Integration circuits for reducing electromigration effect Grant 7,667,328 - Stamper , et al. February 23, 2 | 2010-02-23 |
Through Wafer Via And Method Of Making Same App 20100032808 - Ding; Hanyi ;   et al. | 2010-02-11 |
Through Wafer Vias And Method Of Making Same App 20100032811 - Ding; Hanyi ;   et al. | 2010-02-11 |
Through Wafer Vias And Method Of Making Same App 20100032810 - Ding; Hanyi ;   et al. | 2010-02-11 |
Shallow And Deep Trench Isolation Structures In Semiconductor Integrated Circuits App 20100015765 - Adkisson; James William ;   et al. | 2010-01-21 |
Interconnect Layers Without Electromigration App 20090309223 - Luce; Stephen Ellinwood ;   et al. | 2009-12-17 |
Through Substrate Via Including Variable Sidewall Profile App 20090278237 - Cooney, III; Edward Crandal ;   et al. | 2009-11-12 |
Dielectric layers for metal lines in semiconductor chips Grant 7,598,166 - He , et al. October 6, 2 | 2009-10-06 |
Interconnect layers without electromigration Grant 7,585,758 - Luce , et al. September 8, 2 | 2009-09-08 |
Through Substrate Annular Via Including Plug Filler App 20090206488 - Lindgren; Peter James ;   et al. | 2009-08-20 |
Post last wiring level inductor using patterned plate process Grant 7,573,117 - Chinthakindi , et al. August 11, 2 | 2009-08-11 |
Low Resistance And Inductance Backside Through Vias And Methods Of Fabricating Same App 20090184423 - Erturk; Mete ;   et al. | 2009-07-23 |
Low resistance and inductance backside through vias and methods of fabricating same Grant 7,563,714 - Erturk , et al. July 21, 2 | 2009-07-21 |
Design Structures Including Integrated Circuits For Reducing Electromigration Effect App 20090164964 - Stamper; Anthony Kendall ;   et al. | 2009-06-25 |
Fuse And Pad Stress Relief App 20090155541 - Anderson; Felix Patrick ;   et al. | 2009-06-18 |
Reduced Electromigration And Stressed Induced Migration Of Cu Wires By Surface Coating App 20090142924 - Hu; Chao-Kun ;   et al. | 2009-06-04 |
Annular damascene vertical natural capacitor Grant 7,538,006 - Anderson , et al. May 26, 2 | 2009-05-26 |
Double-sided Integrated Circuit Chips App 20090121260 - Bernstein; Kerry ;   et al. | 2009-05-14 |
Dual Wired Integrated Circuit Chips App 20090121287 - Bernstein; Kerry ;   et al. | 2009-05-14 |
Method for reducing foreign material concentrations in etch chambers Grant 7,517,802 - Cooney, III , et al. April 14, 2 | 2009-04-14 |
Dual-sided Chip Attached Modules App 20090065925 - Bernstein; Kerry ;   et al. | 2009-03-12 |
Method of Integration of a MIM Capacitor with a Lower Plate of Metal Gate Material Formed on an STI Region or a Silicide Region Formed in or on the Surface of a Doped Well with a High K Dielectric Material App 20090004809 - Chinthakindi; Anil Kumar ;   et al. | 2009-01-01 |
Dual-sided chip attached modules Grant 7,462,509 - Bernstein , et al. December 9, 2 | 2008-12-09 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20080293210 - Chinthakindi; Anil Kumar ;   et al. | 2008-11-27 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20080290458 - Chinthakindi; Anil Kumar ;   et al. | 2008-11-27 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20080293233 - Chinthakindi; Anil Kumar ;   et al. | 2008-11-27 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20080277759 - Chinthakindi; Anil Kumar ;   et al. | 2008-11-13 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20080272458 - Chinthakindi; Anil Kumar ;   et al. | 2008-11-06 |
Dual Wired Integrated Circuit Chips App 20080213948 - Bernstein; Kerry ;   et al. | 2008-09-04 |
Integration Circuits For Reducing Electromigration Effect App 20080203495 - Stamper; Anthony Kendall ;   et al. | 2008-08-28 |
Removal Of Etching Process Residual In Semiconductor Fabrication App 20080174015 - Herrin; Russell Thomas ;   et al. | 2008-07-24 |
Dual Wired Integrated Circuit Chips App 20080128812 - Bernstein; Kerry ;   et al. | 2008-06-05 |
Dual wired integrated circuit chips Grant 7,381,627 - Bernstein , et al. June 3, 2 | 2008-06-03 |
Interconnect Layers Without Electromigration App 20080105977 - Luce; Stephen Ellinwood ;   et al. | 2008-05-08 |
By-product Collecting Processes For Cleaning Processes App 20080093212 - Cooney; Edward Crandal ;   et al. | 2008-04-24 |
Integration of a MIM capacitor with a plate formed in a well region and with a high-k dielectric Grant 7,361,950 - Chinthakindi , et al. April 22, 2 | 2008-04-22 |
Dielectric layers for metal lines in semiconductor chips App 20080061403 - He; Zhong-Xiang ;   et al. | 2008-03-13 |
Double-sided Integrated Circuit Chips App 20070267723 - Bernstein; Kerry ;   et al. | 2007-11-22 |
Dual-sided Chip Attached Modules App 20070267746 - Bernstein; Kerry ;   et al. | 2007-11-22 |
Dual Wired Integrated Circuit Chips App 20070267698 - Bernstein; Kerry ;   et al. | 2007-11-22 |
Dual wired integrated circuit chips Grant 7,285,477 - Bernstein , et al. October 23, 2 | 2007-10-23 |
Low Resistance And Inductance Backside Through Vias And Methods Of Fabricating Same App 20070190692 - Erturk; Mete ;   et al. | 2007-08-16 |
Method For Reducing Foreign Material Concentrations In Etch Chambers App 20070066067 - Cooney; Edward Crandal III ;   et al. | 2007-03-22 |
Method for reducing foreign material concentrations in etch chambers Grant 7,192,874 - Cooney, III , et al. March 20, 2 | 2007-03-20 |
Integration Of A Mim Capacitor Over A Metal Gate Or Silicide With High-k Dielectric Materials App 20070057343 - Chinthakindi; Anil Kumar ;   et al. | 2007-03-15 |
Post Last Wiring Level Inductor Using Patterned Plate Process App 20070026659 - Chinthakindi; Anil Kumar ;   et al. | 2007-02-01 |
Reduced electromigration and stressed induced migration of copper wires by surface coating App 20050266673 - Hu, Chao-Kun ;   et al. | 2005-12-01 |
Electrically tunable on-chip resistor Grant 6,960,744 - Adkisson , et al. November 1, 2 | 2005-11-01 |
Method For Manufacturing Self-compensating Resistors Within An Integrated Circuit App 20050227449 - Murphy, William Joseph ;   et al. | 2005-10-13 |
Specially shaped contact via and integrated circuit therewith Grant 6,924,555 - Cronin , et al. August 2, 2 | 2005-08-02 |
Electrically Tunable On-chip Resistor App 20050030149 - Adkisson, James W. ;   et al. | 2005-02-10 |
Method For Reducing Foreign Material Concentrations In Etch Chambers App 20050014369 - Cooney, III, Edward Crandal ;   et al. | 2005-01-20 |
One-mask metal-insulator-metal capacitor and method for forming same Grant 6,750,114 - Adler , et al. June 15, 2 | 2004-06-15 |
Specially shaped contact via and integrated circuit therewith Grant 6,734,564 - Cronin , et al. May 11, 2 | 2004-05-11 |
Specially shaped contact via and integrated circuit therewith App 20040046258 - Cronin, John Edward ;   et al. | 2004-03-11 |
One-mask metal-insulator-metal capacitor and method for forming same App 20030178696 - Adler, Eric ;   et al. | 2003-09-25 |
Dual damascene horn antenna App 20020149530 - Ballantine, Arne Watson ;   et al. | 2002-10-17 |
Method and apparatus for making air gap insulation for semiconductor devices App 20020145201 - Armbrust, Douglas Scott ;   et al. | 2002-10-10 |
One-mask metal-insulator-metal capacitor and method for forming same Grant 6,452,779 - Adler , et al. September 17, 2 | 2002-09-17 |
Reduced electromigration and stressed induced migration of Cu wires by surface coating App 20020098681 - Hu, Chao-Kun ;   et al. | 2002-07-25 |
Reduced electromigration and stressed induced migration of Cu wires by surface coating Grant 6,342,733 - Hu , et al. January 29, 2 | 2002-01-29 |
Plasma treatment to enhance inorganic dielectric adhesion to copper App 20010053591 - Buchwalter, Leena P. ;   et al. | 2001-12-20 |
Method for making a finger capacitor with tuneable dielectric constant Grant 6,303,456 - Pricer , et al. October 16, 2 | 2001-10-16 |
Plasma treatment to enhance inorganic dielectric adhesion to copper Grant 6,261,951 - Buchwalter , et al. July 17, 2 | 2001-07-17 |
Process of making a microcavity structure and applications thereof Grant 5,773,361 - Cronin , et al. June 30, 1 | 1998-06-30 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.