Stammler; Thomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Stammler; Thomas.The latest application filed is for "illumination system for microlithography".

Company Profile

0.10.12

Stammler; Thomas - Aalen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Illumination optical unit for projection lithography and hollow waveguide component therefor Grant 10,151,929 - Deguenther , et al. Dec	2018-12-11
Illumination system for microlithography Grant 10,088,754 - Scholz , et al. October 2, 2	2018-10-02
Illumination System For Microlithography App 20170192361 - Scholz; Axel ; et al.	2017-07-06
Illumination Optical Unit For Projection Lithography And Hollow Waveguide Component Therefor App 20170102551 - Deguenther; Markus ; et al.	2017-04-13
Illumination system for microlithography Grant 9,606,441 - Scholz , et al. March 28, 2	2017-03-28
Illumination System For Microlithography App 20160161858 - Scholz; Axel ; et al.	2016-06-09
Illumination system for microlithography Grant 9,280,060 - Scholz , et al. March 8, 2	2016-03-08
Illumination System For Microlithography App 20150022798 - Scholz; Axel ; et al.	2015-01-22
Illumination system for microlithography Grant 8,873,023 - Scholz , et al. October 28, 2	2014-10-28
Illumination System For Microlithography App 20120019796 - Scholz; Axel ; et al.	2012-01-26
Optical Measurement Apparatus For A Projection Exposure System App 20100079738 - Eisenmenger; Johannes ; et al.	2010-04-01
Optical system and method for improving imaging properties thereof Grant 7,605,914 - Stammler , et al. October 20, 2	2009-10-20
Optical System And Method For Improving Imaging Properties Thereof App 20090225308 - Stammler; Thomas ; et al.	2009-09-10
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements App 20080068599 - Geh; Bernd ; et al.	2008-03-20
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements Grant 7,301,622 - Geh , et al. November 27, 2	2007-11-27
Optical system and method for improving imaging properties thereof App 20070071303 - Stammler; Thomas ; et al.	2007-03-29
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements App 20050254042 - Geh, Bernd ; et al.	2005-11-17
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements Grant 6,934,011 - Geh , et al. August 23, 2	2005-08-23
Method for optimising the image properties of at least two optical elements as well as methods for optimising the image properties of at least three optical elements App 20040090617 - Geh, Bernd ; et al.	2004-05-13
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements Grant 6,678,240 - Geh , et al. January 13, 2	2004-01-13
Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements App 20030071986 - Geh, Bernd ; et al.	2003-04-17

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.