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Patent applications and USPTO patent grants for Stainton; James Nelson.The latest application filed is for "3d microscope and methods of measuring patterned substrates".
Patent | Date |
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3D microscope and methods of measuring patterned substrates Grant 10,209,501 - Hou , et al. Feb | 2019-02-19 |
3D Microscope And Methods Of Measuring Patterned Substrates App 20160252714 - Hou; Zhen ;   et al. | 2016-09-01 |
3D Microscope And Methods Of Measuring Patterned Substrates App 20160253813 - Hou; Zhen ;   et al. | 2016-09-01 |
3D microscope and methods of measuring patterned substrates Grant 9,389,408 - Hou , et al. July 12, 2 | 2016-07-12 |
3D Microscope And Methods Of Measuring Patterned Substrates App 20120019626 - Hou; Zhen ;   et al. | 2012-01-26 |
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