loadpatents
name:-0.017789840698242
name:-0.01783299446106
name:-0.013962984085083
Srinivasan; Sunil Patent Filings

Srinivasan; Sunil

Patent Applications and Registrations

Patent applications and USPTO patent grants for Srinivasan; Sunil.The latest application filed is for "cryogenic atomic layer etch with noble gases".

Company Profile
15.18.21
  • Srinivasan; Sunil - Milpitas CA
  • Srinivasan; Sunil - San Jose CA
  • Srinivasan; Sunil - Pleasanton CA
  • Srinivasan; Sunil - Milipitas CA
  • Srinivasan; Sunil - Tampa FL
  • Srinivasan; Sunil - Sunnyvale CA
  • Srinivasan, Sunil - St. Petersburg FL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer edge ring lifting solution
Grant 11,393,710 - Rice , et al. July 19, 2
2022-07-19
Method of controlling ion energy distribution using a pulse generator
Grant 11,284,500 - Dorf , et al. March 22, 2
2022-03-22
Cryogenic Atomic Layer Etch With Noble Gases
App 20210398815 - GARCIA DE GORORDO; Alvaro ;   et al.
2021-12-23
Cryogenic atomic layer etch with noble gases
Grant 11,087,989 - Garcia De Gorordo , et al. August 10, 2
2021-08-10
Universal process kit
Grant 11,049,760 - Joubert , et al. June 29, 2
2021-06-29
Adjustable extended electrode for edge uniformity control
Grant 10,991,556 - Luere , et al. April 27, 2
2021-04-27
In-situ Atomic Layer Deposition Process
App 20200373149 - PARK; Sang Wook ;   et al.
2020-11-26
Method Of Controlling Ion Energy Distribution Using A Pulse Generator
App 20200352017 - DORF; Leonid ;   et al.
2020-11-05
Method of controlling ion energy distribution using a pulse generator with a current-return output stage
Grant 10,791,617 - Dorf , et al. September 29, 2
2020-09-29
Integrated Cleaning Process For Substrate Etching
App 20200194242 - Zhou; Yi ;   et al.
2020-06-18
Method Of Controlling Ion Energy Distribution Using A Pulse Generator With A Current-return Output Stage
App 20200154556 - DORF; Leonid ;   et al.
2020-05-14
Adjustable Extended Electrode For Edge Uniformity Control
App 20200118798 - LUERE; Olivier ;   et al.
2020-04-16
Method of controlling ion energy distribution using a pulse generator with a current-return output stage
Grant 10,555,412 - Dorf , et al. Fe
2020-02-04
Adjustable extended electrode for edge uniformity control
Grant 10,553,404 - Luere , et al. Fe
2020-02-04
In-situ Deposition Process
App 20200027717 - PARK; Sang Wook ;   et al.
2020-01-23
Adjustable extended electrode for edge uniformity control
Grant 10,504,702 - Luere , et al. Dec
2019-12-10
Method Of Controlling Ion Energy Distribution Using A Pulse Generator With A Current-return Output Stage
App 20190350072 - DORF; Leonid ;   et al.
2019-11-14
Method of controlling ion energy distribution using a pulse generator with a current-return output stage
Grant 10,448,494 - Dorf , et al. Oc
2019-10-15
Method of controlling ion energy distribution using a pulse generator with a current-return output stage
Grant 10,448,495 - Dorf , et al. Oc
2019-10-15
Processing With Powered Edge Ring
App 20190228952 - DORF; Leonid ;   et al.
2019-07-25
Adjustable Extended Electrode For Edge Uniformity Control
App 20180315583 - LUERE; Olivier ;   et al.
2018-11-01
Adjustable extended electrode for edge uniformity control
Grant 10,103,010 - Luere , et al. October 16, 2
2018-10-16
Adjustable Extended Electrode For Edge Uniformity Control
App 20180233334 - LUERE; Olivier ;   et al.
2018-08-16
Adjustable Extended Electrode For Edge Uniformity Control
App 20180218933 - LUERE; Olivier ;   et al.
2018-08-02
Adjustable extended electrode for edge uniformity control
Grant 9,947,517 - Luere , et al. April 17, 2
2018-04-17
Systems And Methods For Controlling A Voltage Waveform At A Substrate During Plasma Processing
App 20170358431 - DORF; LEONID ;   et al.
2017-12-14
Composite edge ring
Grant D797,691 - Joubert , et al. September 19, 2
2017-09-19
Universal Process Kit
App 20170256435 - JOUBERT; Olivier ;   et al.
2017-09-07
Wafer Edge Ring Lifting Solution
App 20170213758 - RICE; Michael R. ;   et al.
2017-07-27
Component For Semiconductor Process Chamber Having Surface Treatment To Reduce Particle Emission
App 20160056059 - SUN; Jennifer ;   et al.
2016-02-25
Multi-film stack etching with polymer passivation of an overlying etched layer
Grant 8,747,684 - Srinivasan , et al. June 10, 2
2014-06-10
Method to minimize CD etch bias
Grant 8,187,483 - Plumhoff , et al. May 29, 2
2012-05-29
Shallow trench isolation etch process
Grant 8,133,817 - Sasano , et al. March 13, 2
2012-03-13
Multi-film Stack Etching With Polymer Passivation Of An Overlying Etched Layer
App 20110045672 - Srinivasan; Sunil ;   et al.
2011-02-24
Shallow Trench Isolation Etch Process
App 20090170333 - Sasano; Hiroki ;   et al.
2009-07-02
Method to Minimize CD Etch Bias
App 20080035606 - Plumhoff; Jason ;   et al.
2008-02-14
Notch-Free Etching of High Aspect SOI Structures Using A Time Division Multiplex Process and RF Bias Modulation
App 20070175856 - Johnson; David ;   et al.
2007-08-02
Notch-free etching of high aspect SOI structures using a time division multiplex process and RF bias modulation
App 20050112891 - Johnson, David ;   et al.
2005-05-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed