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Patent applications and USPTO patent grants for Srinivasan; Lakshman.The latest application filed is for "automatic defect repair system".
Patent | Date |
---|---|
Automatic defect repair system Grant 7,761,182 - Gallarda , et al. July 20, 2 | 2010-07-20 |
Automatic defect repair system App 20060226865 - Gallarda; Harry ;   et al. | 2006-10-12 |
Automated repetitive array microstructure defect inspection Grant 7,065,239 - Maayah , et al. June 20, 2 | 2006-06-20 |
Automated repetitive array microstructure defect inspection App 20030076989 - Maayah, Kais Jameel ;   et al. | 2003-04-24 |
Method for characterizing defects on semiconductor wafers Grant 5,808,735 - Lee , et al. September 15, 1 | 1998-09-15 |
Method of establishing thresholds for image comparison Grant 5,798,830 - Srinivasan August 25, 1 | 1998-08-25 |
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