loadpatents
name:-0.0056881904602051
name:-0.011910915374756
name:-0.00088095664978027
Spuler; Bruno Patent Filings

Spuler; Bruno

Patent Applications and Registrations

Patent applications and USPTO patent grants for Spuler; Bruno.The latest application filed is for "method of forming an isolation layer and method of manufacturing a trench capacitor".

Company Profile
0.10.3
  • Spuler; Bruno - Munchen DE
  • Spuler; Bruno - Weixdorf DE
  • Spuler; Bruno - Wappinger Falls NY
  • Spuler; Bruno - Munich DE
  • Spuler; Bruno - Wappingers Falls NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of forming an isolation layer and method of manufacturing a trench capacitor
Grant 6,984,556 - Drabe , et al. January 10, 2
2006-01-10
Method of forming an isolation layer and method of manufacturing a trench capacitor
App 20040198015 - Drabe, Christian ;   et al.
2004-10-07
Semiconductor device with self-aligned contact and method for manufacturing the device
Grant 6,784,553 - Zedlitz , et al. August 31, 2
2004-08-31
Method for forming dual damascene structure
Grant 6,521,542 - Armacost , et al. February 18, 2
2003-02-18
Semiconductor device with self-aligned contact and method for manufacturing the device
App 20020187630 - Zedlitz, Ralf ;   et al.
2002-12-12
Method for clamping a semiconductor device in a manufacturing process
App 20020132393 - Kraxenberger, Manfred ;   et al.
2002-09-19
Method of improving the etch resistance of chemically amplified photoresists by introducing silicon after patterning
Grant 6,379,869 - Schroeder , et al. April 30, 2
2002-04-30
Metallization etching techniques for reducing post-etch corrosion of metal lines
Grant 6,177,353 - Gutsche , et al. January 23, 2
2001-01-23
Low pressure and low power C1.sub.2 /HC1 process for sub-micron metal etching
Grant 5,976,986 - Naeem , et al. November 2, 1
1999-11-02
Deposition of carbon into nitride layer for improved selectivity of oxide to nitride etchrate for self aligned contact etching
Grant 5,935,873 - Spuler , et al. August 10, 1
1999-08-10
Polycide etching with HCL and chlorine
Grant 5,874,363 - Hoh , et al. February 23, 1
1999-02-23
Method for forming metallization in semiconductor devices with a self-planarizing material
Grant 5,854,126 - Tobben , et al. December 29, 1
1998-12-29
Methods for metal etching with reduced sidewall build up during integrated circuit manufacturing
Grant 5,846,884 - Naeem , et al. December 8, 1
1998-12-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed