Sprong; Hans Peter
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sprong; Hans Peter.The latest application filed is for "determining changes in the x-ray emission yield of an x-ray source".
- Sprong; Hans Peter - Eindhoven NL
| Patent | Date |
|---|---|
| Determining changes in the x-ray emission yield of an x-ray source Grant 9,370,084 - Sprong , et al. June 14, 2 | 2016-06-14 |
| Determining Changes In The X-ray Emission Yield Of An X-ray Source App 20130223594 - Sprong; Hans Peter ; et al. | 2013-08-29 |
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