loadpatents
name:-0.069405078887939
name:-0.13394594192505
name:-0.00050806999206543
Sporck; A. Nicholas Patent Filings

Sporck; A. Nicholas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sporck; A. Nicholas.The latest application filed is for "method and apparatus for testing devices using serially controlled intelligent switches".

Company Profile
0.19.23
  • Sporck; A. Nicholas - Saratoga CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches
App 20110267085 - Berry; Tommie Edward ;   et al.
2011-11-03
AC coupled parameteric test probe
Grant 7,952,375 - Eldridge , et al. May 31, 2
2011-05-31
Sharing resources in a system for testing semiconductor devices
Grant 7,852,094 - Chraft , et al. December 14, 2
2010-12-14
Test system with wireless communications
Grant 7,821,255 - Khandros , et al. October 26, 2
2010-10-26
Wireless test system
Grant 7,675,311 - Khandros , et al. March 9, 2
2010-03-09
Mechanically reconfigurable vertical tester interface for IC probing
Grant 7,659,736 - Eldridge , et al. February 9, 2
2010-02-09
Method and apparatus for switching tester resources
Grant 7,649,366 - Henson , et al. January 19, 2
2010-01-19
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
App 20100000080 - Eldridge; Benjamin N. ;   et al.
2010-01-07
Probe card assembly and kit
Grant 7,616,016 - Eldridge , et al. November 10, 2
2009-11-10
Wireless Test Cassette
App 20090251162 - Khandros; Igor Y. ;   et al.
2009-10-08
Apparatus and method for managing thermally induced motion of a probe card assembly
Grant 7,592,821 - Eldridge , et al. September 22, 2
2009-09-22
Integrated circuit assembly
Grant 7,550,842 - Khandros , et al. June 23, 2
2009-06-23
Testing an electronic device using test data from a plurality of testers
Grant 7,548,055 - Khandros , et al. June 16, 2
2009-06-16
Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches
App 20090085590 - Berry; Tommie Edward ;   et al.
2009-04-02
Probe Card Assembly And Kit
App 20080180121 - Khandros; Igor Y. ;   et al.
2008-07-31
Sharing Resources In A System For Testing Semiconductor Devices
App 20080136432 - Chraft; Matthew E. ;   et al.
2008-06-12
Probe card assembly and kit
Grant 7,352,196 - Khandros , et al. April 1, 2
2008-04-01
Method And Appartus For Switching Tester Resources
App 20080054917 - Henson; Roy J. ;   et al.
2008-03-06
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
App 20080042668 - Eldridge; Benjamin N. ;   et al.
2008-02-21
AC coupled parameteric test probe
App 20070296435 - Eldridge; Benjamin N. ;   et al.
2007-12-27
Apparatus and method for managing thermally induced motion of a probe card assembly
Grant 7,285,968 - Eldridge , et al. October 23, 2
2007-10-23
Mechanically Reconfigurable Vertical Tester Interface For Ic Probing
App 20070229102 - Eldridge; Benjamin N. ;   et al.
2007-10-04
Wireless Test System
App 20070210822 - Khandros; Igor Y. ;   et al.
2007-09-13
Wireless Test Cassette
App 20070182438 - Khandros; Igor Y. ;   et al.
2007-08-09
Mechanically reconfigurable vertical tester interface for IC probing
Grant 7,230,437 - Eldridge , et al. June 12, 2
2007-06-12
Wireless test system
Grant 7,218,094 - Khandros , et al. May 15, 2
2007-05-15
Systems and methods for wireless semiconductor device testing
Grant 7,202,687 - Khandros , et al. April 10, 2
2007-04-10
Probe Card Assembly And Kit
App 20060279300 - Khandros; Igor Y. ;   et al.
2006-12-14
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
App 20060255814 - Eldridge; Benjamin N. ;   et al.
2006-11-16
Probe card assembly and kit
Grant 7,064,566 - Khandros , et al. June 20, 2
2006-06-20
Probe card assembly
Grant 7,061,257 - Khandros , et al. June 13, 2
2006-06-13
Mechanically reconfigurable vertical tester interface for IC probing
App 20050277323 - Eldridge, Benjamin N. ;   et al.
2005-12-15
Wireless test cassette
App 20050225347 - Khandros, Igor Y. ;   et al.
2005-10-13
Probe card with coplanar daughter card
App 20050140381 - Sporck, A. Nicholas ;   et al.
2005-06-30
Wireless test system
App 20050086021 - Khandros, Igor Y. ;   et al.
2005-04-21
Probe card assembly
App 20050035347 - Khandros, Igor Y. ;   et al.
2005-02-17
Probe card with coplanar daughter card
Grant 6,856,150 - Sporck , et al. February 15, 2
2005-02-15
Integrated circuit assembly
App 20040113250 - Khandros, Igor Y. ;   et al.
2004-06-17
Probe card assembly
App 20030222667 - Khandros, Igor Y. JR. ;   et al.
2003-12-04
Probe card with coplanar daughter card
App 20020145437 - Sporck, A. Nicholas ;   et al.
2002-10-10
Probe Card Assembly And Kit
App 20010054905 - KHANDROS, IGOR Y. ;   et al.
2001-12-27
Stroboscopic photometer
Grant 5,646,406 - Sporck , et al. July 8, 1
1997-07-08

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed