loadpatents
Patent applications and USPTO patent grants for Sporck; A. Nicholas.The latest application filed is for "method and apparatus for testing devices using serially controlled intelligent switches".
Patent | Date |
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Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches App 20110267085 - Berry; Tommie Edward ;   et al. | 2011-11-03 |
AC coupled parameteric test probe Grant 7,952,375 - Eldridge , et al. May 31, 2 | 2011-05-31 |
Sharing resources in a system for testing semiconductor devices Grant 7,852,094 - Chraft , et al. December 14, 2 | 2010-12-14 |
Test system with wireless communications Grant 7,821,255 - Khandros , et al. October 26, 2 | 2010-10-26 |
Wireless test system Grant 7,675,311 - Khandros , et al. March 9, 2 | 2010-03-09 |
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,659,736 - Eldridge , et al. February 9, 2 | 2010-02-09 |
Method and apparatus for switching tester resources Grant 7,649,366 - Henson , et al. January 19, 2 | 2010-01-19 |
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20100000080 - Eldridge; Benjamin N. ;   et al. | 2010-01-07 |
Probe card assembly and kit Grant 7,616,016 - Eldridge , et al. November 10, 2 | 2009-11-10 |
Wireless Test Cassette App 20090251162 - Khandros; Igor Y. ;   et al. | 2009-10-08 |
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,592,821 - Eldridge , et al. September 22, 2 | 2009-09-22 |
Integrated circuit assembly Grant 7,550,842 - Khandros , et al. June 23, 2 | 2009-06-23 |
Testing an electronic device using test data from a plurality of testers Grant 7,548,055 - Khandros , et al. June 16, 2 | 2009-06-16 |
Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches App 20090085590 - Berry; Tommie Edward ;   et al. | 2009-04-02 |
Probe Card Assembly And Kit App 20080180121 - Khandros; Igor Y. ;   et al. | 2008-07-31 |
Sharing Resources In A System For Testing Semiconductor Devices App 20080136432 - Chraft; Matthew E. ;   et al. | 2008-06-12 |
Probe card assembly and kit Grant 7,352,196 - Khandros , et al. April 1, 2 | 2008-04-01 |
Method And Appartus For Switching Tester Resources App 20080054917 - Henson; Roy J. ;   et al. | 2008-03-06 |
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20080042668 - Eldridge; Benjamin N. ;   et al. | 2008-02-21 |
AC coupled parameteric test probe App 20070296435 - Eldridge; Benjamin N. ;   et al. | 2007-12-27 |
Apparatus and method for managing thermally induced motion of a probe card assembly Grant 7,285,968 - Eldridge , et al. October 23, 2 | 2007-10-23 |
Mechanically Reconfigurable Vertical Tester Interface For Ic Probing App 20070229102 - Eldridge; Benjamin N. ;   et al. | 2007-10-04 |
Wireless Test System App 20070210822 - Khandros; Igor Y. ;   et al. | 2007-09-13 |
Wireless Test Cassette App 20070182438 - Khandros; Igor Y. ;   et al. | 2007-08-09 |
Mechanically reconfigurable vertical tester interface for IC probing Grant 7,230,437 - Eldridge , et al. June 12, 2 | 2007-06-12 |
Wireless test system Grant 7,218,094 - Khandros , et al. May 15, 2 | 2007-05-15 |
Systems and methods for wireless semiconductor device testing Grant 7,202,687 - Khandros , et al. April 10, 2 | 2007-04-10 |
Probe Card Assembly And Kit App 20060279300 - Khandros; Igor Y. ;   et al. | 2006-12-14 |
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly App 20060255814 - Eldridge; Benjamin N. ;   et al. | 2006-11-16 |
Probe card assembly and kit Grant 7,064,566 - Khandros , et al. June 20, 2 | 2006-06-20 |
Probe card assembly Grant 7,061,257 - Khandros , et al. June 13, 2 | 2006-06-13 |
Mechanically reconfigurable vertical tester interface for IC probing App 20050277323 - Eldridge, Benjamin N. ;   et al. | 2005-12-15 |
Wireless test cassette App 20050225347 - Khandros, Igor Y. ;   et al. | 2005-10-13 |
Probe card with coplanar daughter card App 20050140381 - Sporck, A. Nicholas ;   et al. | 2005-06-30 |
Wireless test system App 20050086021 - Khandros, Igor Y. ;   et al. | 2005-04-21 |
Probe card assembly App 20050035347 - Khandros, Igor Y. ;   et al. | 2005-02-17 |
Probe card with coplanar daughter card Grant 6,856,150 - Sporck , et al. February 15, 2 | 2005-02-15 |
Integrated circuit assembly App 20040113250 - Khandros, Igor Y. ;   et al. | 2004-06-17 |
Probe card assembly App 20030222667 - Khandros, Igor Y. JR. ;   et al. | 2003-12-04 |
Probe card with coplanar daughter card App 20020145437 - Sporck, A. Nicholas ;   et al. | 2002-10-10 |
Probe Card Assembly And Kit App 20010054905 - KHANDROS, IGOR Y. ;   et al. | 2001-12-27 |
Stroboscopic photometer Grant 5,646,406 - Sporck , et al. July 8, 1 | 1997-07-08 |
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