Patent | Date |
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Apparatuses and methods for high speed writing test mode for memories Grant 10,614,904 - Dietrich , et al. | 2020-04-07 |
Apparatuses And Methods For High Speed Writing Test Mode For Memories App 20190051369 - Dietrich; Stefan ;   et al. | 2019-02-14 |
Apparatuses and methods for high speed writing test mode for memories Grant 10,134,482 - Dietrich , et al. November 20, 2 | 2018-11-20 |
Apparatuses And Methods For High Speed Writing Test Mode For Memories App 20180204630 - Dietrich; Stefan ;   et al. | 2018-07-19 |
Multi-port DRAM architecture for accessing different memory partitions Grant 8,914,589 - Gregorius , et al. December 16, 2 | 2014-12-16 |
Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type Grant 8,635,393 - Dortu , et al. January 21, 2 | 2014-01-21 |
Method and system including plural memory controllers and a memory access control bus for accessing a memory device Grant 8,495,310 - Gregorius , et al. July 23, 2 | 2013-07-23 |
Concept for reducing crosstalk Grant 7,957,254 - Spirkl , et al. June 7, 2 | 2011-06-07 |
Methods and apparatuses for generating a random sequence of commands for a semiconductor device Grant 7,865,795 - Nirmaier , et al. January 4, 2 | 2011-01-04 |
Memory with an output register for test data and process for testing a memory and memory module Grant 7,757,132 - Spirkl , et al. July 13, 2 | 2010-07-13 |
Method and apparatus for sending data from a memory Grant 7,757,064 - Balb , et al. July 13, 2 | 2010-07-13 |
Asynchronous data transmission Grant 7,746,724 - Mayer , et al. June 29, 2 | 2010-06-29 |
Clock signal synchronizing device with inherent duty-cycle correction capability Grant 7,728,636 - Spirkl , et al. June 1, 2 | 2010-06-01 |
Multi Master Dram Architecture App 20100077157 - Gregorius; Peter ;   et al. | 2010-03-25 |
Multi-port Dram Architecture App 20100077139 - GREGORIUS; PETER ;   et al. | 2010-03-25 |
Integrated circuit Grant 7,649,130 - Spirkl , et al. January 19, 2 | 2010-01-19 |
Methods And Apparatuses For Generating A Random Sequence Of Commands For A Semiconductor Device App 20090222779 - Nirmaier; Thomas ;   et al. | 2009-09-03 |
Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data Grant 7,515,456 - Mayer , et al. April 7, 2 | 2009-04-07 |
Clock Signal Synchronizing Device With Inherent Duty-cycle Correction Capability App 20090045856 - Spirkl; Wolfgang ;   et al. | 2009-02-19 |
Semiconductor memory device Grant 7,489,153 - Spirkl February 10, 2 | 2009-02-10 |
Method, Device And Computer Program For Evaluating A Signal Transmission App 20080319693 - Spirkl; Wolfgang ;   et al. | 2008-12-25 |
Apparatus and method for controlling a driver strength Grant 7,439,761 - Mayer , et al. October 21, 2 | 2008-10-21 |
Method for checking the refresh function of an information memory Grant 7,437,629 - Spirkl , et al. October 14, 2 | 2008-10-14 |
Concept for Reducing Crosstalk App 20080232233 - Spirkl; Wolfgang ;   et al. | 2008-09-25 |
Device And Method For Performing A Test Of Semiconductor Devices With An Optical Interface App 20080204056 - Spirkl; Wolfgang ;   et al. | 2008-08-28 |
Methods And Systems For Storing Data Based On A Reliability Requirement App 20080189481 - Mayer; Peter ;   et al. | 2008-08-07 |
Optical Multi Mode Transmission Between A Processor And A Set Of Memories App 20080181081 - MAYER; PETER ;   et al. | 2008-07-31 |
Asynchronous Data Transmission App 20080183956 - MAYER; PETER ;   et al. | 2008-07-31 |
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods Grant 7,398,444 - Brox , et al. July 8, 2 | 2008-07-08 |
Display with memory for storing picture data App 20080117223 - Mayer; Peter ;   et al. | 2008-05-22 |
Method And Apparatus For Refreshing Memory Cells Of A Memory App 20080080284 - Mayer; Peter ;   et al. | 2008-04-03 |
Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data App 20080062743 - Mayer; Peter ;   et al. | 2008-03-13 |
Method And Apparatus For Sending Data From A Memory App 20080065851 - Balb; Markus ;   et al. | 2008-03-13 |
Memory With Memory Banks And Mode Registers And Method Of Operating A Memory App 20080056051 - Mayer; Peter ;   et al. | 2008-03-06 |
System And Method Of Connecting A Processing Unit With A Memory Unit App 20080059687 - Mayer; Peter ;   et al. | 2008-03-06 |
Semiconductor circuit device and a system for testing a semiconductor apparatus Grant 7,331,005 - Arnold , et al. February 12, 2 | 2008-02-12 |
Apparatus And Method For Controlling A Driver Strength App 20080012598 - Mayer; Peter ;   et al. | 2008-01-17 |
Memory With An Output Register For Test Data And Process For Testing A Memory And Memory Module App 20080010438 - Spirkl; Wolfgang ;   et al. | 2008-01-10 |
Self test for the phase angle of the data read clock signal DQS Grant 7,307,895 - Kuhn , et al. December 11, 2 | 2007-12-11 |
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits Grant 7,308,628 - Spirkl , et al. December 11, 2 | 2007-12-11 |
Method of testing a mapping of an electrical circuit Grant 7,299,447 - Spirkl November 20, 2 | 2007-11-20 |
Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type App 20070030751 - Dortu; Jean-Marc ;   et al. | 2007-02-08 |
Memory apparatus having a short word line cycle time and method for operating a memory apparatus Grant 7,092,300 - Dortu , et al. August 15, 2 | 2006-08-15 |
Integrated circuit App 20060170483 - Spirkl; Wolfgang ;   et al. | 2006-08-03 |
Self test for the phase angle of the data read clock signal DQS App 20060064620 - Kuhn; Justus ;   et al. | 2006-03-23 |
Method and arrangement for testing output circuits of high speed semiconductor memory devices Grant 7,016,244 - Sommer , et al. March 21, 2 | 2006-03-21 |
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods App 20060059397 - Brox; Martin ;   et al. | 2006-03-16 |
Loop-back method for measuring the interface timing of semiconductor memory devices using the normal mode memory App 20060059394 - Spirkl; Wolfgang | 2006-03-16 |
Semiconductor circuit device and a system for testing a semiconductor apparatus App 20060026475 - Arnold; Ralf ;   et al. | 2006-02-02 |
Semiconductor memory device App 20060002226 - Spirkl; Wolfgang | 2006-01-05 |
Memory apparatus having a short word line cycle time and method for operating a memory apparatus App 20050135139 - Dortu, Jean-Marc ;   et al. | 2005-06-23 |
Method and configuration for the output of bit error tables from semiconductor devices Grant 6,910,163 - Janik , et al. June 21, 2 | 2005-06-21 |
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits App 20050108603 - Spirkl, Wolfgang ;   et al. | 2005-05-19 |
Method for determining the temperature of a memory cell from transistor threshold voltage Grant 6,877,897 - Braun , et al. April 12, 2 | 2005-04-12 |
Method and arrangement for testing output circuits of high speed semiconductor memory devices App 20050030781 - Sommer, Stefan ;   et al. | 2005-02-10 |
Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit Grant 6,812,689 - Krause , et al. November 2, 2 | 2004-11-02 |
Method for testing the refresh device of an information memory Grant 6,779,136 - Richter , et al. August 17, 2 | 2004-08-17 |
Method for testing integrated semiconductor memory devices Grant 6,751,140 - Schmolz , et al. June 15, 2 | 2004-06-15 |
Method for checking the refresh function of an information memory App 20040008559 - Spirkl, Wolfgang ;   et al. | 2004-01-15 |
Semiconductor memory with refresh and method for operating the semiconductor memory Grant 6,639,862 - Spirkl October 28, 2 | 2003-10-28 |
Method and configuration for the output of bit error tables from semiconductor devices App 20030079164 - Janik, Thomas ;   et al. | 2003-04-24 |
Method of testing a mapping of an electrical circuit App 20030061582 - Spirkl, Wolfgang | 2003-03-27 |
Method for testing integrated semiconductor memory devices App 20030053353 - Schmolz, Paul ;   et al. | 2003-03-20 |
Semiconductor memory with refresh and method for operating the semiconductor memory App 20020136077 - Spirkl, Wolfgang | 2002-09-26 |
Method for determining the temperature of a semiconductor component App 20020101906 - Braun, Jens ;   et al. | 2002-08-01 |
Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit App 20020000828 - Krause, Gunnar ;   et al. | 2002-01-03 |
Address generator for generating addresses for an on-chip trim circuit App 20010054127 - Krause, Gunnar ;   et al. | 2001-12-20 |
Method for testing the refresh device of an information memory App 20010027541 - Richter, Detlev ;   et al. | 2001-10-04 |