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name:-0.036731004714966
name:-0.025309801101685
name:-0.00048208236694336
Spirkl; Wolfgang Patent Filings

Spirkl; Wolfgang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Spirkl; Wolfgang.The latest application filed is for "apparatuses and methods for high speed writing test mode for memories".

Company Profile
0.32.39
  • Spirkl; Wolfgang - Germering DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatuses and methods for high speed writing test mode for memories
Grant 10,614,904 - Dietrich , et al.
2020-04-07
Apparatuses And Methods For High Speed Writing Test Mode For Memories
App 20190051369 - Dietrich; Stefan ;   et al.
2019-02-14
Apparatuses and methods for high speed writing test mode for memories
Grant 10,134,482 - Dietrich , et al. November 20, 2
2018-11-20
Apparatuses And Methods For High Speed Writing Test Mode For Memories
App 20180204630 - Dietrich; Stefan ;   et al.
2018-07-19
Multi-port DRAM architecture for accessing different memory partitions
Grant 8,914,589 - Gregorius , et al. December 16, 2
2014-12-16
Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type
Grant 8,635,393 - Dortu , et al. January 21, 2
2014-01-21
Method and system including plural memory controllers and a memory access control bus for accessing a memory device
Grant 8,495,310 - Gregorius , et al. July 23, 2
2013-07-23
Concept for reducing crosstalk
Grant 7,957,254 - Spirkl , et al. June 7, 2
2011-06-07
Methods and apparatuses for generating a random sequence of commands for a semiconductor device
Grant 7,865,795 - Nirmaier , et al. January 4, 2
2011-01-04
Memory with an output register for test data and process for testing a memory and memory module
Grant 7,757,132 - Spirkl , et al. July 13, 2
2010-07-13
Method and apparatus for sending data from a memory
Grant 7,757,064 - Balb , et al. July 13, 2
2010-07-13
Asynchronous data transmission
Grant 7,746,724 - Mayer , et al. June 29, 2
2010-06-29
Clock signal synchronizing device with inherent duty-cycle correction capability
Grant 7,728,636 - Spirkl , et al. June 1, 2
2010-06-01
Multi Master Dram Architecture
App 20100077157 - Gregorius; Peter ;   et al.
2010-03-25
Multi-port Dram Architecture
App 20100077139 - GREGORIUS; PETER ;   et al.
2010-03-25
Integrated circuit
Grant 7,649,130 - Spirkl , et al. January 19, 2
2010-01-19
Methods And Apparatuses For Generating A Random Sequence Of Commands For A Semiconductor Device
App 20090222779 - Nirmaier; Thomas ;   et al.
2009-09-03
Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data
Grant 7,515,456 - Mayer , et al. April 7, 2
2009-04-07
Clock Signal Synchronizing Device With Inherent Duty-cycle Correction Capability
App 20090045856 - Spirkl; Wolfgang ;   et al.
2009-02-19
Semiconductor memory device
Grant 7,489,153 - Spirkl February 10, 2
2009-02-10
Method, Device And Computer Program For Evaluating A Signal Transmission
App 20080319693 - Spirkl; Wolfgang ;   et al.
2008-12-25
Apparatus and method for controlling a driver strength
Grant 7,439,761 - Mayer , et al. October 21, 2
2008-10-21
Method for checking the refresh function of an information memory
Grant 7,437,629 - Spirkl , et al. October 14, 2
2008-10-14
Concept for Reducing Crosstalk
App 20080232233 - Spirkl; Wolfgang ;   et al.
2008-09-25
Device And Method For Performing A Test Of Semiconductor Devices With An Optical Interface
App 20080204056 - Spirkl; Wolfgang ;   et al.
2008-08-28
Methods And Systems For Storing Data Based On A Reliability Requirement
App 20080189481 - Mayer; Peter ;   et al.
2008-08-07
Optical Multi Mode Transmission Between A Processor And A Set Of Memories
App 20080181081 - MAYER; PETER ;   et al.
2008-07-31
Asynchronous Data Transmission
App 20080183956 - MAYER; PETER ;   et al.
2008-07-31
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
Grant 7,398,444 - Brox , et al. July 8, 2
2008-07-08
Display with memory for storing picture data
App 20080117223 - Mayer; Peter ;   et al.
2008-05-22
Method And Apparatus For Refreshing Memory Cells Of A Memory
App 20080080284 - Mayer; Peter ;   et al.
2008-04-03
Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data
App 20080062743 - Mayer; Peter ;   et al.
2008-03-13
Method And Apparatus For Sending Data From A Memory
App 20080065851 - Balb; Markus ;   et al.
2008-03-13
Memory With Memory Banks And Mode Registers And Method Of Operating A Memory
App 20080056051 - Mayer; Peter ;   et al.
2008-03-06
System And Method Of Connecting A Processing Unit With A Memory Unit
App 20080059687 - Mayer; Peter ;   et al.
2008-03-06
Semiconductor circuit device and a system for testing a semiconductor apparatus
Grant 7,331,005 - Arnold , et al. February 12, 2
2008-02-12
Apparatus And Method For Controlling A Driver Strength
App 20080012598 - Mayer; Peter ;   et al.
2008-01-17
Memory With An Output Register For Test Data And Process For Testing A Memory And Memory Module
App 20080010438 - Spirkl; Wolfgang ;   et al.
2008-01-10
Self test for the phase angle of the data read clock signal DQS
Grant 7,307,895 - Kuhn , et al. December 11, 2
2007-12-11
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits
Grant 7,308,628 - Spirkl , et al. December 11, 2
2007-12-11
Method of testing a mapping of an electrical circuit
Grant 7,299,447 - Spirkl November 20, 2
2007-11-20
Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type
App 20070030751 - Dortu; Jean-Marc ;   et al.
2007-02-08
Memory apparatus having a short word line cycle time and method for operating a memory apparatus
Grant 7,092,300 - Dortu , et al. August 15, 2
2006-08-15
Integrated circuit
App 20060170483 - Spirkl; Wolfgang ;   et al.
2006-08-03
Self test for the phase angle of the data read clock signal DQS
App 20060064620 - Kuhn; Justus ;   et al.
2006-03-23
Method and arrangement for testing output circuits of high speed semiconductor memory devices
Grant 7,016,244 - Sommer , et al. March 21, 2
2006-03-21
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
App 20060059397 - Brox; Martin ;   et al.
2006-03-16
Loop-back method for measuring the interface timing of semiconductor memory devices using the normal mode memory
App 20060059394 - Spirkl; Wolfgang
2006-03-16
Semiconductor circuit device and a system for testing a semiconductor apparatus
App 20060026475 - Arnold; Ralf ;   et al.
2006-02-02
Semiconductor memory device
App 20060002226 - Spirkl; Wolfgang
2006-01-05
Memory apparatus having a short word line cycle time and method for operating a memory apparatus
App 20050135139 - Dortu, Jean-Marc ;   et al.
2005-06-23
Method and configuration for the output of bit error tables from semiconductor devices
Grant 6,910,163 - Janik , et al. June 21, 2
2005-06-21
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits
App 20050108603 - Spirkl, Wolfgang ;   et al.
2005-05-19
Method for determining the temperature of a memory cell from transistor threshold voltage
Grant 6,877,897 - Braun , et al. April 12, 2
2005-04-12
Method and arrangement for testing output circuits of high speed semiconductor memory devices
App 20050030781 - Sommer, Stefan ;   et al.
2005-02-10
Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit
Grant 6,812,689 - Krause , et al. November 2, 2
2004-11-02
Method for testing the refresh device of an information memory
Grant 6,779,136 - Richter , et al. August 17, 2
2004-08-17
Method for testing integrated semiconductor memory devices
Grant 6,751,140 - Schmolz , et al. June 15, 2
2004-06-15
Method for checking the refresh function of an information memory
App 20040008559 - Spirkl, Wolfgang ;   et al.
2004-01-15
Semiconductor memory with refresh and method for operating the semiconductor memory
Grant 6,639,862 - Spirkl October 28, 2
2003-10-28
Method and configuration for the output of bit error tables from semiconductor devices
App 20030079164 - Janik, Thomas ;   et al.
2003-04-24
Method of testing a mapping of an electrical circuit
App 20030061582 - Spirkl, Wolfgang
2003-03-27
Method for testing integrated semiconductor memory devices
App 20030053353 - Schmolz, Paul ;   et al.
2003-03-20
Semiconductor memory with refresh and method for operating the semiconductor memory
App 20020136077 - Spirkl, Wolfgang
2002-09-26
Method for determining the temperature of a semiconductor component
App 20020101906 - Braun, Jens ;   et al.
2002-08-01
Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit
App 20020000828 - Krause, Gunnar ;   et al.
2002-01-03
Address generator for generating addresses for an on-chip trim circuit
App 20010054127 - Krause, Gunnar ;   et al.
2001-12-20
Method for testing the refresh device of an information memory
App 20010027541 - Richter, Detlev ;   et al.
2001-10-04

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