Spies; Petra

Patent Applications and Registrations

Patent applications and USPTO patent grants for Spies; Petra.The latest application filed is for "method and apparatus for examining a beam of charged particles".

Company Profile

1.10.8

Spies; Petra - Mainz DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And Apparatus For Examining A Beam Of Charged Particles App 20210110996 - Rhinow; Daniel ; et al.	2021-04-15
Method and apparatus for processing a substrate with a focused particle beam Grant 9,721,754 - Bret , et al. August 1, 2	2017-08-01
Method for electron beam induced etching Grant 9,023,666 - Auth , et al. May 5, 2	2015-05-05
Method And Apparatus For Protecting A Substrate During Processing By A Particle Beam App 20140255831 - Hofmann; Thorsten ; et al.	2014-09-11
Method for electron beam induced etching of layers contaminated with gallium Grant 8,632,687 - Auth , et al. January 21, 2	2014-01-21
Methods and systems for removing a material from a sample Grant 8,623,230 - Auth , et al. January 7, 2	2014-01-07
Method for electron beam induced deposition of conductive material Grant 8,318,593 - Auth , et al. November 27, 2	2012-11-27
Method And Apparatus For Processing A Substrate With A Focused Particle Beam App 20120273458 - Bret; Tristan ; et al.	2012-11-01
Method For Electron Beam Induced Deposition Of Conductive Material App 20110183517 - Auth; Nicole ; et al.	2011-07-28
Method For Electron Beam Induced Etching Of Layers Contaminated With Gallium App 20110183523 - Auth; Nicole ; et al.	2011-07-28
Method For Electron Beam Induced Etching App 20110183444 - Auth; Nicole ; et al.	2011-07-28
Methods And Systems For Removing A Material From A Sample App 20100282596 - Auth; Nicole ; et al.	2010-11-11
Method for high-resolution processing of thin layers using electron beams Grant 7,786,403 - Koops , et al. August 31, 2	2010-08-31
Method for high-resolution processing of thin layers using electron beams App 20050087514 - Koops, Hans ; et al.	2005-04-28

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.