Spallas; James P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Spallas; James P..The latest application filed is for "imaging apparatus having a plurality of movable beam columns, and method of inspecting a plurality of regions of a substrate intended to be substantially identical".

Company Profile

0.10.7

Spallas; James P. - San Ramon CA
Spallas; James P. - Alamo CA
Spallas; James P. - Dublin CA
Spallas; James P - Dublin CA
Spallas; James P. - Ithaca NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Imaging apparatus having a plurality of movable beam columns, and method of inspecting a plurality of regions of a substrate intended to be substantially identical Grant 10,026,588 - Werder , et al. July 17, 2	2018-07-17
Imaging Apparatus Having A Plurality Of Movable Beam Columns, And Method Of Inspecting A Plurality Of Regions Of A Substrate Intended To Be Substantially Identical App 20160064185 - Werder; Kurt Stephen ; et al.	2016-03-03
High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope Grant 9,099,276 - Muray , et al. August 4, 2	2015-08-04
High-voltage Energy-dispersive Spectroscopy Using A Low-voltage Scanning Electron Microscope App 20150213995 - Muray; Lawrence P. ; et al.	2015-07-30
Layered scanning charged particle apparatus package having an embedded heater Grant 8,115,168 - Muray , et al. February 14, 2	2012-02-14
Layered scanning charged particle microscope package for a charged particle and radiation detector Grant 8,110,801 - Indermuehle , et al. February 7, 2	2012-02-07
Layered scanning charged particle microscope with differential pumping aperture Grant 8,106,358 - Spallas , et al. January 31, 2	2012-01-31
Layered Scanning Charged Particle Microscope Package For A Charged Particle And Radiation Detector App 20100224779 - Indermuehle; Scott W. ; et al.	2010-09-09
Layered Scanning Charged Particle Microscope With Differential Pumping Aperture App 20100224777 - Spallas; James P. ; et al.	2010-09-09
Layered Scanning Charged Particle Apparatus Package Having An Embedded Heater App 20100224778 - Muray; Lawrence P. ; et al.	2010-09-09
MEMS structure with mechanical overdeflection limiter Grant 6,805,454 - Staker , et al. October 19, 2	2004-10-19
MEMS structure with mechanical overdeflection limiter App 20040001263 - Staker, Bryan P. ; et al.	2004-01-01
MEMS structure with mechanical overdeflection limiter Grant 6,641,273 - Staker , et al. November 4, 2	2003-11-04
Parallel plate electron multiplier Grant 6,642,637 - Spallas , et al. November 4, 2	2003-11-04
Silicon on insulator standoff and method for manufacture thereof App 20030197176 - Spallas, James P. ; et al.	2003-10-23
Silicon tip field emission cathodes Grant 5,627,427 - Das , et al. May 6, 1	1997-05-06
Silicon tip field emission cathode arrays and fabrication thereof Grant 5,199,917 - MacDonald , et al. April 6, 1	1993-04-06

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