Souma; Akira
Patent Applications and Registrations
Patent applications and USPTO patent grants for Souma; Akira.The latest application filed is for "contact probe and probe card".
- Souma; Akira - Tokyo JP
- Souma; Akira - Kitakyushu JP
- Souma; Akira - Musashino JP
- SOUMA; Akira - Toyko JP
- Souma; Akira - Fukuoka JP
- Souma; Akira - Aomori JP
- Souma; Akira - Hirakawa JP
- Souma; Akira - Hirakawa-shi JP
| Patent | Date |
|---|---|
| Contact probe and probe card Grant 9,146,257 - Uebayashi , et al. September 29, 2 | 2015-09-29 |
| Electronic device and power converter provided with electronic device Grant 8,908,374 - Takatsuka , et al. December 9, 2 | 2014-12-09 |
| Electric contact Grant D702,646 - Uebayashi , et al. April 15, 2 | 2014-04-15 |
| Contact Probe And Probe Card App 20140043055 - UEBAYASHI; Masatomo ; et al. | 2014-02-13 |
| Electronic Device And Power Converter Provided With Electronic Device App 20120287576 - TAKATSUKA; Yushi ; et al. | 2012-11-15 |
| Current test probe having a solder guide portion, and related probe assembly and production method Grant 7,888,958 - Souma , et al. February 15, 2 | 2011-02-15 |
| Probe For Current Test, Probe Assembly And Production Method Thereof App 20100213956 - Souma; Akira ; et al. | 2010-08-26 |
| Probe for electrical test and probe assembly Grant 7,557,593 - Hirakawa , et al. July 7, 2 | 2009-07-07 |
| Probe For Electrical Test App 20090009197 - HIRAKAWA; Hideki ; et al. | 2009-01-08 |
| Probe For Electrical Test And Probe Assembly App 20070210813 - Hirakawa; Hideki ; et al. | 2007-09-13 |
| Probe use in electric test App 20070018633 - Hirakawa; Hideki ; et al. | 2007-01-25 |
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