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SORKIN; Alexander Patent Filings

SORKIN; Alexander

Patent Applications and Registrations

Patent applications and USPTO patent grants for SORKIN; Alexander.The latest application filed is for "ion beam delayering system and method, topographically enhanced delayered sample produced thereby, and imaging methods and systems related thereto".

Company Profile
1.6.6
  • SORKIN; Alexander - Nepean CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Ion Beam Delayering System And Method, Topographically Enhanced Delayered Sample Produced Thereby, And Imaging Methods And Systems Related Thereto
App 20220005669 - PAWLOWICZ; Christopher ;   et al.
2022-01-06
Methods, systems and devices relating to distortion correction in imaging devices
Grant 10,469,777 - Pawlowicz , et al. No
2019-11-05
Circuit tracing using a focused ion beam
Grant 9,915,628 - Pawlowicz , et al. March 13, 2
2018-03-13
Methods, Systems And Devices Relating To Distortion Correction In Imaging Devices
App 20180054575 - PAWLOWICZ; Christopher ;   et al.
2018-02-22
Circuit tracing using a focused ion beam
Grant 9,529,040 - Pawlowicz , et al. December 27, 2
2016-12-27
Circuit Tracing Using A Focused Ion Beam
App 20160282287 - PAWLOWICZ; Christopher ;   et al.
2016-09-29
Circuit tracing using a focused ion beam
Grant 9,383,327 - Pawlowicz , et al. July 5, 2
2016-07-05
Circuit Tracing Using A Focused Ion Beam
App 20160187419 - PAWLOWICZ; Christopher ;   et al.
2016-06-30
Circuit Tracing Using A Focused Ion Beam
App 20140319343 - Pawlowicz; Chris ;   et al.
2014-10-30
Circuit tracing using a focused ion beam
Grant 8,791,436 - Pawlowicz , et al. July 29, 2
2014-07-29

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