Song; Yunsheng

Patent Applications and Registrations

Patent applications and USPTO patent grants for Song; Yunsheng.The latest application filed is for "methods of detecting faults in real-time for semiconductor wafers".

Company Profile

0.35.34

Song; Yunsheng - Poughkeepsie NY
Song; Yunsheng - Hopewell Junction NY US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods of detecting faults in real-time for semiconductor wafers Grant 10,109,046 - Finlay , et al. October 23, 2	2018-10-23
Methods Of Detecting Faults In Real-time For Semiconductor Wafers App 20180025483 - FINLAY; Robert Boyd ; et al.	2018-01-25
LCR test circuit structure for detecting metal gate defect conditions Grant 9,780,007 - Ouyang , et al. October 3, 2	2017-10-03
Method for manufacturing in a semiconductor device a low resistance via without a bottom liner Grant 9,559,051 - Xin , et al. January 31, 2	2017-01-31
Configurable interposer Grant 9,524,930 - Gluschenkov , et al. December 20, 2	2016-12-20
Voltage contrast characterization structures and methods for within chip process variation characterization Grant 9,519,210 - Patterson , et al. December 13, 2	2016-12-13
Voltage Contrast Characterization Structures And Methods For Within Chip Process Variation Characterization App 20160148849 - Patterson; Oliver D. ; et al.	2016-05-26
Semiconductor memory device employing a ferromagnetic gate Grant 9,337,334 - Mallela , et al. May 10, 2	2016-05-10
Semiconductor Memory Device Employing A Ferromagnetic Gate App 20150303313 - Mallela; Hari V. ; et al.	2015-10-22
Yield enhancement for stacked chips through rotationally-connecting-interposer Grant 9,151,781 - Gluschenkov , et al. October 6, 2	2015-10-06
Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stacking Grant 9,029,234 - Safran , et al. May 12, 2	2015-05-12
Random coded integrated circuit structures and methods of making random coded integrated circuit structures Grant 8,803,328 - Song , et al. August 12, 2	2014-08-12
Random Coded Integrated Circuit Structures And Methods Of Making Random Coded Integrated Circuit Structures App 20140203448 - Song; Yunsheng ; et al.	2014-07-24
Configurable interposer Grant 8,759,152 - Gluschenkov , et al. June 24, 2	2014-06-24
Configurable Interposer App 20140145351 - Gluschenkov; Oleg ; et al.	2014-05-29
Physical Design Symmetry And Integrated Circuits Enabling Threedimentional (3d) Yield Optimization For Wafer To Wafer Stacking App 20130307159 - Safran; John Matthew ; et al.	2013-11-21
Wafer alignment system with optical coherence tomography Grant 8,489,225 - Xin , et al. July 16, 2	2013-07-16
Lcr Test Circuit Structure For Detecting Metal Gate Defect Conditions App 20130169308 - Ouyang; Xu ; et al.	2013-07-04
Security control of analysis results Grant 8,429,193 - Song , et al. April 23, 2	2013-04-23
Method for compensating for tool processing variation in the routing of wafers/lots Grant 8,369,976 - Wong , et al. February 5, 2	2013-02-05
Method And System For Defect-bitmap-fail Patterns Matching Analysis Including Peripheral Defects App 20130016895 - Song; Zhigang ; et al.	2013-01-17
Monitoring a process sector in a production facility Grant 8,340,800 - Cote , et al. December 25, 2	2012-12-25
Detecting asymmetrical transistor leakage defects Grant 8,294,485 - Ouyang , et al. October 23, 2	2012-10-23
Configurable Interposer App 20120241977 - Gluschenkov; Oleg ; et al.	2012-09-27
Wafer Alignment System With Optical Coherence Tomography App 20120232686 - Xin; Yongchun ; et al.	2012-09-13
Configurable interposer Grant 8,237,278 - Gluschenkov , et al. August 7, 2	2012-08-07
Tool commonality and stratification analysis to enhance a production process Grant 8,234,001 - Rice , et al. July 31, 2	2012-07-31
Yield Enhancement For Stacked Chips Through Rotationally-connecting-interposer App 20120146682 - Gluschenkov; Oleg ; et al.	2012-06-14
Yield enhancement for stacked chips through rotationally-connecting-interposer Grant 8,159,247 - Gluschenkov , et al. April 17, 2	2012-04-17
Geometry based electrical hotspot detection in integrated circuit layouts Grant 8,108,803 - Heng , et al. January 31, 2	2012-01-31
Method for optimizing the routing of wafers/lots based on yield Grant 8,095,230 - Ouyang , et al. January 10, 2	2012-01-10
Methods, systems, and computer program products for product randomization and analysis in a manufacturing environment Grant 8,015,040 - Cianfrani , et al. September 6, 2	2011-09-06
Method of optimizing queue times in a production cycle Grant 8,005,560 - Rawlins , et al. August 23, 2	2011-08-23
Multidimensional process window optimization in semiconductor manufacturing Grant 7,962,234 - Song , et al. June 14, 2	2011-06-14
Computer program product for excluding variations attributable to equipment used in semiconductor wafer manufacturing from split analysis procedures Grant 7,953,680 - Ouyang , et al. May 31, 2	2011-05-31
Configurable Interposer App 20110115082 - Gluschenkov; Oleg ; et al.	2011-05-19
Geometry Based Electrical Hotspot Detection In Integrated Circuit Layouts App 20110099529 - Heng; Fook-Luen ; et al.	2011-04-28
Yield Enhancement For Stacked Chips Through Rotationally-connecting-interposer App 20110080189 - Gluschenkov; Oleg ; et al.	2011-04-07
Tool Commonality And Stratification Analysis To Enhance A Production Process App 20110077765 - Rice; James ; et al.	2011-03-31
Method of establishing a lot grade system for product lots in a semiconductor manufacturing process Grant 7,908,023 - Crawford , et al. March 15, 2	2011-03-15
Real time system for monitoring the commonality, sensitivity, and repeatability of test probes Grant 7,856,332 - Karthikeyan , et al. December 21, 2	2010-12-21
Method And System Of Commonality Analysis For Lots With Scrapped Wafer App 20100204940 - Barthold; Gasner J. ; et al.	2010-08-12
Detecting Asymmetrical Transistor Leakage Defects App 20100201376 - Ouyang; Xu ; et al.	2010-08-12
Security Control Of Analysis Results App 20100185675 - Song; Yunsheng ; et al.	2010-07-22
Method of adaptively selecting chips for reducing in-line testing in a semiconductor manufacturing line Grant 7,682,842 - Desineni , et al. March 23, 2	2010-03-23
Monitoring A Process Sector In A Production Facility App 20100017010 - Cote; William ; et al.	2010-01-21
Method For Compensating For Tool Processing Variation In The Routing Of Wafers/lots App 20090319074 - Wong; Keith Kwong Hon ; et al.	2009-12-24
Method For Optimizing The Routing Of Wafers/lots Based On Yield App 20090317924 - Ouyang; Xu ; et al.	2009-12-24
Multidimensional Process Window Optimization In Semiconductor Manufacturing App 20090306807 - Song; Yunsheng ; et al.	2009-12-10
Method of Adaptively Selecting Chips for Reducing In-line Testing in a Semiconductor Manufacturing Line App 20090299679 - DESINENI; RAO H. ; et al.	2009-12-03
Method Of Establishing A Lot Grade System For Product Lots In A Semiconductor Manufacturing Process App 20090182447 - Crawford; Edward J. ; et al.	2009-07-16
Methods And Computer Program Products For Excluding Variations Attributable To Equipment From Split Analysis Procedures App 20090150811 - Ouyang; Xu ; et al.	2009-06-11
Real Time System For Monitoring The Commonality, Sensitivity, And Repeatability Of Test Probes App 20090143999 - Karthikeyan; Muthukumarasamy ; et al.	2009-06-04
Automated Yield Split Lot (ewr) And Process Change Notification (pcn) Analysis System App 20090125829 - DALTON; ANDREW S. ; et al.	2009-05-14
Advanced Correlation And Process Window Evaluation Application App 20090119357 - Rice; James P. ; et al.	2009-05-07
Method Of Optimizing Queue Times In A Production Cycle App 20090105854 - Rawlins; Brad J. ; et al.	2009-04-23
Methods, Systems, And Computer Program Products For Product Randomization And Analysis In A Manufacturing Environment App 20080183321 - Cianfrani; Susan M. ; et al.	2008-07-31
Data mining to detect performance quality of tools used repetitively in manufacturing Grant 7,337,033 - Ontalus , et al. February 26, 2	2008-02-26
Data Mining To Detect Performance Quality Of Tools Used Repetitively In Manufacturing App 20080033589 - Ontalus; Viorel ; et al.	2008-02-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.