Song; Jae Myeong
Patent Applications and Registrations
Patent applications and USPTO patent grants for Song; Jae Myeong.The latest application filed is for "wheel bearing assembly".
- Song; Jae Myeong - Gyeonggi-do KR
- Song; Jae Myeong - Osan-si KR
- Song; Jae-Myeong - Seongnam-si N/A KR
- Song; Jae Myeong - Kyonggi-do KR
- Song, Jae Myeong - Seongnam-shi KR
| Patent | Date |
|---|---|
| Wheel bearing assembly Grant 10,189,309 - Song , et al. Ja | 2019-01-29 |
| Wheel Bearing Assembly App 20180043733 - SONG; Jae Myeong ; et al. | 2018-02-15 |
| Structure and method for coupling wheel bearings Grant 9,636,946 - Song , et al. May 2, 2 | 2017-05-02 |
| Wheel bearing assembly Grant 9,145,027 - Song , et al. September 29, 2 | 2015-09-29 |
| Structure And Method For Coupling Wheel Bearings App 20150054334 - Song; Jae Myeong ; et al. | 2015-02-26 |
| Three dimensional shape measurement apparatus and method Grant 8,878,929 - Kim , et al. November 4, 2 | 2014-11-04 |
| Wheel Bearing Assembly App 20140183932 - Song; Jae Myeong ; et al. | 2014-07-03 |
| Three Dimensional Shape Measurement Apparatus And Method App 20140010438 - KIM; Ho ; et al. | 2014-01-09 |
| Three Dimensional Shape Measurement Apparatus And Method App 20100302364 - KIM; Ho ; et al. | 2010-12-02 |
| Carrier For Carrying A Packaged Chip And Handler Equipped With The Carrier App 20080260505 - Kang; Kyoung Won ; et al. | 2008-10-23 |
| Carrier For Carrying A Packaged Chip And Handler Equipped With The Carrier App 20080260976 - Kang; Kyoung Won ; et al. | 2008-10-23 |
| Method Of Transferring Test Trays In A Handler App 20080145203 - YUN; Hyo-chul ; et al. | 2008-06-19 |
| Methods for compensating for a test temperature deviation Grant 7,008,804 - Song , et al. March 7, 2 | 2006-03-07 |
| Device for compensating for a test temperature deviation in a semiconductor device handler Grant 6,861,861 - Song , et al. March 1, 2 | 2005-03-01 |
| Handler for testing semiconductor device App 20040181961 - Hwang, Ji Hyun ; et al. | 2004-09-23 |
| Device for compensating for a test temperature deviation in a semiconductor device handler App 20040017185 - Song, Jae Myeong ; et al. | 2004-01-29 |
| Methods for compensating for a test temperature deviation App 20040019452 - Song, Jae Myeong ; et al. | 2004-01-29 |
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