Son; Tae-Sik

Patent Applications and Registrations

Patent applications and USPTO patent grants for Son; Tae-Sik.The latest application filed is for "power-down method for system having volatile memory devices".

Company Profile

0.7.6

Son; Tae-Sik - Seongnam-Si N/A KR
Son; Tae-Sik - Gyeonggi-do KR
Son; Tae-Sik - Yongin-si KR
Son; Tae-sik - Yongin KR
Son, Tae-sik - Yongin-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Power-down method for system having volatile memory devices Grant 8,656,199 - Cho , et al. February 18, 2	2014-02-18
Power-down Method For System Having Volatile Memory Devices App 20110219248 - Cho; Beom-Sig ; et al.	2011-09-08
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device Grant 7,880,493 - Kim , et al. February 1, 2	2011-02-01
Probe Pad, Substrate Having A Semiconductor Device, Method Of Testing A Semiconductor Device And Tester For Testing A Semiconductor Device App 20100013506 - KIM; Kun-Up ; et al.	2010-01-21
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device Grant 7,616,020 - Kim , et al. November 10, 2	2009-11-10
Semiconductor device including wire bonding pads and pad layout method Grant 7,476,983 - Kim , et al. January 13, 2	2009-01-13
Pad structure, pad layout structure, and pad layout method in semiconductor devices App 20060255477 - Kim; Na-Rae ; et al.	2006-11-16
Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device App 20050258854 - Kim, Kun-Up ; et al.	2005-11-24
Semiconductor memory device with driving circuits for screening defective wordlines and related methods Grant 6,961,282 - Son November 1, 2	2005-11-01
Semiconductor memory devices with driving circuits for screening defective wordlines and related methods App 20040160850 - Son, Tae-Sik	2004-08-19
Wordline driver for ensuring equal stress to wordlines in multi row address disturb test and method of driving the wordline driver Grant 6,657,915 - Seo , et al. December 2, 2	2003-12-02
Wordline driver for ensuring equal stress to wordlines in multi row address disturb test and method of driving the wordline driver App 20020067644 - Seo, Young-soon ; et al.	2002-06-06

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