Some; Daniel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Some; Daniel.The latest application filed is for "wafer inspection system".

Company Profile

0.8.10

Some; Daniel - Ashdod IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wafer Inspection System App 20110141462 - Reinhorn; Silviu ; et al.	2011-06-16
Multi-detector defect detection system and a method for detecting defects Grant 7,693,323 - Levin , et al. April 6, 2	2010-04-06
High speed laser scanning inspection system Grant 7,589,835 - Some September 15, 2	2009-09-15
Laser inspection using diffractive elements for enhancement and suppression of surface features Grant 7,433,053 - Some October 7, 2	2008-10-07
High Speed Laser Scanning Inspection System App 20080212081 - Some; Daniel	2008-09-04
High speed laser scanning inspection system Grant 7,365,836 - Some April 29, 2	2008-04-29
High speed laser scanning inspection system Grant 7,359,045 - Some April 15, 2	2008-04-15
High speed laser scanning inspection system App 20060132758 - Some; Daniel	2006-06-22
Optical technique for detecting buried defects in opaque films Grant 7,027,142 - Some April 11, 2	2006-04-11
Method and system for optical inspection of an object Grant 7,006,224 - Some February 28, 2	2006-02-28
Wafer inspection system App 20060012791 - Reinhorn; Silviu ; et al.	2006-01-19
Apparatus and method for dual spot inspection of repetitive patterns Grant 6,943,898 - Libinson , et al. September 13, 2	2005-09-13
Method and system for optical inspection of an object App 20040125375 - Some, Daniel	2004-07-01
Laser inspection using diffractive elements for enhancement and suppression of surface features App 20040027564 - Some, Daniel	2004-02-12
High speed laser scanning inspection system App 20030227618 - Some, Daniel	2003-12-11
Apparatus and method for dual spot inspection of repetitive patterns App 20030210402 - Libinson, Alexander ; et al.	2003-11-13
Optical technique for detecting buried defects in opaque films App 20030206292 - Some, Daniel	2003-11-06
Muli-detector defect detection system and a method for detecting defects App 20030174878 - Levin, Evgeni ; et al.	2003-09-18

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