Solvision, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Solvision, Inc..The latest application filed is for "system and method for object inspection using relief determination".

Company Profile

0.6.5

Solvision, Inc. - Boucherville Quebec UNKNOWN
SOLVISION INC. - 50 De Lauzon, Suite 100 Boucherville CA
SOLVISION INC. - Brossard CA
SOLVISION INC. - Longueuil CA
SOLVISION INC. -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for height profile measurement of reflecting objects Grant 7,522,289 - Cantin , et al. April 21, 2	2009-04-21
System and method for simultaneous 3D height measurements on multiple sides of an object Grant 7,433,058 - Cantin , et al. October 7, 2	2008-10-07
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object Grant 7,403,650 - Coulombe , et al. July 22, 2	2008-07-22
System And Method For Object Inspection Using Relief Determination App 20080117438 - Quirion; Benoit ; et al.	2008-05-22
Fast 3d Height Measurement Method And System App 20080068617 - Cantin; Michel ; et al.	2008-03-20
System For Simultaneous Projections Of Multiple Phase-shifted Patterns For The Three-dimensional Inspection Of An Object App 20070146727 - Coulombe; Alain ; et al.	2007-06-28
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object Grant 7,079,666 - Coulombe , et al. July 18, 2	2006-07-18
Method and system for measuring the relief of an object Grant 7,023,559 - Coulombe , et al. April 4, 2	2006-04-04
Method and system for detecting defects on a printed circuit board Grant 6,771,807 - Coulombe , et al. August 3, 2	2004-08-03
Shadow-free 3D and 2D measurement system and method App 20040047517 - Berard, Louis ; et al.	2004-03-11
System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object App 20020018118 - Coulombe, Alain ; et al.	2002-02-14

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