Soga; Akira

Patent Applications and Registrations

Patent applications and USPTO patent grants for Soga; Akira.The latest application filed is for "model generation system and model generation method".

Company Profile

0.7.7

Soga; Akira - Kita JP
Soga; Akira - Tokyo JP
Soga; Akira - Yokohama JP
Soga, Akira - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Model generation system and model generation method Grant 10,853,538 - Nishida , et al. December 1, 2	2020-12-01
Manufacturing control system, manufacturing control method, and manufacturing control program Grant 10,387,532 - Soga A	2019-08-20
Model Generation System And Model Generation Method App 20180285495 - NISHIDA; Yukihito ; et al.	2018-10-04
Manufacturing supporting system, manufacturing supporting method, and manufacturing supporting program for electronic device Grant 10,001,774 - Yamada , et al. June 19, 2	2018-06-19
Production support system, production support method, and production support program Grant 9,760,085 - Yamada , et al. September 12, 2	2017-09-12
Manufacturing Supporting System, Manufacturing Supporting Method, And Manufacturing Supporting Program For Electronic Device App 20160011589 - YAMADA; Muneyoshi ; et al.	2016-01-14
Production Support System, Production Support Method, And Production Support Program App 20150081241 - YAMADA; Muneyoshi ; et al.	2015-03-19
Manufacturing Control System, Amnufacturing Control Method, And Manufacturing Control Program App 20140088903 - SOGA; Akira	2014-03-27
Product repair support system, product manufacturing system, and product manufacturing method Grant 8,019,456 - Soga September 13, 2	2011-09-13
Product Repair Support System, Product Manufacturing System, And Product Manufacturing Method App 20080208381 - SOGA; Akira	2008-08-28
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers Grant 6,780,657 - Ino , et al. August 24, 2	2004-08-24
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers Grant 6,541,287 - Ino , et al. April 1, 2	2003-04-01
Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers App 20020192847 - Ino, Tomomi ; et al.	2002-12-19
Temperature Measuring Method And Apparatus, Measuring Mehtod For The Thickness Of The Formed Film, Measuring Apparatus For The Thickness Of The Formed Film Thermometer For Wafers App 20020066859 - INO, TOMOMI ; et al.	2002-06-06

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