Sofer; Yotam

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sofer; Yotam.The latest application filed is for "method of examining specimens and system thereof".

Company Profile

9.8.9

Sofer; Yotam - Givatayim IL
Sofer; Yotam - Givataim IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method Of Examining Specimens And System Thereof App 20220291138 - Sofer; Yotam ; et al.	2022-09-15
Selecting a coreset of potential defects for estimating expected defects of interest Grant 11,360,030 - Sofer , et al. June 14, 2	2022-06-14
Method Of Examining Specimens And System Thereof App 20210239623 - SOFER; Yotam ; et al.	2021-08-05
Guided inspection of a semiconductor wafer based on spatial density analysis Grant 11,060,981 - Hirszhorn , et al. July 13, 2	2021-07-13
Method of examining defects in a semiconductor specimen and system thereof Grant 10,937,706 - Sofer , et al. March 2, 2	2021-03-02
Process window analysis Grant 10,720,367 - Kaizerman , et al.	2020-07-21
Guided inspection of a semiconductor wafer based on systematic defects Grant 10,605,745 - Sofer , et al.	2020-03-31
Method Of Examining Defects In A Semiconductor Specimen And System Thereof App 20200075434 - SOFER; Yotam ; et al.	2020-03-05
Guided Inspection Of A Semiconductor Wafer Based On Systematic Defects App 20200003700 - Sofer; Yotam ; et al.	2020-01-02
Method of examining defects in a semiconductor specimen and system thereof Grant 10,504,805 - Sofer , et al. Dec	2019-12-10
Process Window Analysis App 20190355628 - KAIZERMAN; Idan ; et al.	2019-11-21
Guided Inspection Of A Semiconductor Wafer Based On Spatial Density Analysis App 20190293569 - HIRSZHORN; Ariel ; et al.	2019-09-26
Process window analysis Grant 10,312,161 - Kaizerman , et al.	2019-06-04
Method Of Examining Defects In A Semiconductor Specimen And System Thereof App 20190067134 - SOFER; Yotam ; et al.	2019-02-28
Method for adaptive sampling in examining an object and system thereof Grant 10,190,991 - Sofer , et al. Ja	2019-01-29
Method For Adaptive Sampling In Examining An Object And System Thereof App 20180306728 - SOFER; Yotam ; et al.	2018-10-25
Process Window Analysis App 20160284579 - KAIZERMAN; Idan ; et al.	2016-09-29

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