Smolinski; Jacek G.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Smolinski; Jacek G..The latest application filed is for "determining lithographic set point using optical proximity correction verification simulation".
- Smolinski; Jacek G. - Jericho VT US
- Smolinski; Jacek G. - Essex Junction VT
| Patent | Date |
|---|---|
| Determining lithographic set point using optical proximity correction verification simulation Grant 8,619,236 - Bruce , et al. December 31, 2 | 2013-12-31 |
| Method for creating electrically testable patterns Grant 8,219,964 - Bruce , et al. July 10, 2 | 2012-07-10 |
| Determining Lithographic Set Point Using Optical Proximity Correction Verification Simulation App 20120127442 - BRUCE; JAMES A. ; et al. | 2012-05-24 |
| Method For Creating Electrically Testable Patterns App 20110173586 - Bruce; James A. ; et al. | 2011-07-14 |
| OPC verification using auto-windowed regions Grant 7,562,337 - Bruce , et al. July 14, 2 | 2009-07-14 |
| Method and apparatus for parallel data preparation and processing of integrated circuit graphical design data Grant 7,434,185 - Dooling , et al. October 7, 2 | 2008-10-07 |
| Opc Verification Using Auto-windowed Regions App 20080141211 - Bruce; James A. ; et al. | 2008-06-12 |
| Method And Apparatus For Parallel Data Preparation And Processing Of Integrated Circuit Graphical Design Data App 20080077891 - Dooling; Daria R. ; et al. | 2008-03-27 |
| Design verification Grant 7,269,808 - Bruce , et al. September 11, 2 | 2007-09-11 |
| Design Verification App 20060270268 - Bruce; James A. ; et al. | 2006-11-30 |
| Fill pattern inspection Grant 6,654,488 - Behun , et al. November 25, 2 | 2003-11-25 |
| Methods for repair of photomasks Grant 6,165,649 - Grenon , et al. December 26, 2 | 2000-12-26 |
| Method for repair of photomasks Grant 6,156,461 - Grenon , et al. December 5, 2 | 2000-12-05 |
| Methods for repair of photomasks Grant 6,090,507 - Grenon , et al. July 18, 2 | 2000-07-18 |
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