Smith; Taber H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Smith; Taber H..The latest application filed is for "bubble-free liquid filling of fluidic chambers".

Company Profile

3.20.22

Smith; Taber H. - Saratoga CA
Smith; Taber H. - Fremont CA
Smith; Taber H. - San Jose CA
Smith; Taber H. - Dallas TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Bubble-free Liquid Filling Of Fluidic Chambers App 20220134327 - Myers, III; Frank B. ; et al.	2022-05-05
Multiplexed Biological Assay Device With Electronic Readout App 20200122142 - Myers, III; Frank B. ; et al.	2020-04-23
Multiplexed biological assay device with electronic readout Grant 10,549,275 - Myers, III , et al. Fe	2020-02-04
Multiplexed Biological Assay Device With Electronic Readout App 20190076841 - Myers, III; Frank B. ; et al.	2019-03-14
Characterization and reduction of variation for integrated circuits Grant 8,001,516 - Smith , et al. August 16, 2	2011-08-16
Electronic design for integrated circuits based on process related variations Grant 7,962,867 - White , et al. June 14, 2	2011-06-14
Methods and systems for implementing dummy fill for integrated circuits Grant 7,757,195 - Smith , et al. July 13, 2	2010-07-13
Characterization and verification for integrated circuit designs Grant 7,712,056 - White , et al. May 4, 2	2010-05-04
Characterization And Reduction Of Variation For Integrated Circuits App 20090031261 - SMITH; Taber H. ; et al.	2009-01-29
Electronic Design for Integrated Circuits Based on Process Related Variations App 20080216027 - White; David ; et al.	2008-09-04
Dummy fill for integrated circuits Grant 7,393,755 - Smith , et al. July 1, 2	2008-07-01
Characterization and reduction of variation for integrated circuits Grant 7,383,521 - Smith , et al. June 3, 2	2008-06-03
Dummy fill for integrated circuits Grant 7,380,220 - Smith , et al. May 27, 2	2008-05-27
Adjustment of masks for integrated circuit fabrication Grant 7,367,008 - White , et al. April 29, 2	2008-04-29
Integrated circuit metrology Grant 7,363,099 - Smith , et al. April 22, 2	2008-04-22
Dummy fill for integrated circuits Grant 7,363,598 - Smith , et al. April 22, 2	2008-04-22
Use of models in integrated circuit fabrication Grant 7,360,179 - Smith , et al. April 15, 2	2008-04-15
Dummy fill for integrated circuits Grant 7,356,783 - Smith , et al. April 8, 2	2008-04-08
Electronic design for integrated circuits based on process related variations Grant 7,353,475 - White , et al. April 1, 2	2008-04-01
Electronic design for integrated circuits based process related variations Grant 7,325,206 - White , et al. January 29, 2	2008-01-29
Test masks for lithographic and etch processes Grant 7,243,316 - White , et al. July 10, 2	2007-07-10
Characterization and verification for integrated circuit designs App 20070157139 - White; David ; et al.	2007-07-05
Methods and systems for implementing dummy fill for integrated circuits App 20070101305 - Smith; Taber H. ; et al.	2007-05-03
Characterization and verification for integrated circuit designs Grant 7,174,520 - White , et al. February 6, 2	2007-02-06
Dummy fill for integrated circuits Grant 7,152,215 - Smith , et al. December 19, 2	2006-12-19
Dummy fill for integrated circuits Grant 7,124,386 - Smith , et al. October 17, 2	2006-10-17
Use of models in integrated circuit fabrication App 20050235246 - Smith, Taber H. ; et al.	2005-10-20
Dummy fill for integrated circuits App 20050196964 - Smith, Taber H. ; et al.	2005-09-08
Characterization and reduction of variation for integrated circuits App 20050132306 - Smith, Taber H. ; et al.	2005-06-16
Dummy fill for integrated circuits App 20050051809 - Smith, Taber H. ; et al.	2005-03-10
Dummy fill for integrated circuits App 20050037522 - Smith, Taber H. ; et al.	2005-02-17
Characterization and verification for integrated circuit designs App 20030237064 - White, David ; et al.	2003-12-25
Dummy fill for integrated circuits App 20030229479 - Smith, Taber H. ; et al.	2003-12-11
Use of models in integrated circuit fabrication App 20030229875 - Smith, Taber H. ; et al.	2003-12-11
Dummy fill for integrated circuits App 20030226757 - Smith, Taber H. ; et al.	2003-12-11
Integrated circuit metrology App 20030229410 - Smith, Taber H. ; et al.	2003-12-11
Dummy fill for integrated circuits App 20030228714 - Smith, Taber H. ; et al.	2003-12-11
Adjustment of masks for integrated circuit fabrication App 20030229881 - White, David ; et al.	2003-12-11
Electronic design for integrated circuits based on process related variations App 20030229412 - White, David ; et al.	2003-12-11
Electronic design for integrated circuits based process related variations App 20030229868 - White, David ; et al.	2003-12-11
Test masks for lithographic and etch processes App 20030229880 - White, David ; et al.	2003-12-11
Monitor of plasma processes with multivariate statistical analysis of plasma emission spectra Grant 6,153,115 - Le , et al. November 28, 2	2000-11-28

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.