loadpatents
name:-0.0032110214233398
name:-0.025987863540649
name:-0.0010390281677246
Smith; Ian R. Patent Filings

Smith; Ian R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Smith; Ian R..The latest application filed is for "optical system for scanning microscope".

Company Profile
0.21.1
  • Smith; Ian R. - Los Gatos CA
  • Smith; Ian R. - London GB2
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Power assisted automatic supervised classifier creation tool for semiconductor defects
Grant 6,999,614 - Bakker , et al. February 14, 2
2006-02-14
Optical system for scanning microscope
App 20010054691 - Park, Sang-Il ;   et al.
2001-12-27
Scanning probe microscope with scan correction
Grant 6,265,718 - Park , et al. July 24, 2
2001-07-24
Scanning probe microscope with multimode head
Grant 6,130,427 - Park , et al. October 10, 2
2000-10-10
Scanning probe microscope with scan correction
Grant 6,057,547 - Park , et al. May 2, 2
2000-05-02
Scanning probe microscope with scan correction
Grant 5,939,719 - Park , et al. August 17, 1
1999-08-17
Scanning probe microscope having a single viewing device for on-axis and oblique optical views
Grant 5,877,891 - Park , et al. March 2, 1
1999-03-02
Scanning probe microscope having a single viewing device for on-axis and oblique angle views
Grant 5,714,756 - Park , et al. February 3, 1
1998-02-03
Large stage system for scanning probe microscopes and other instruments
Grant 5,672,816 - Park , et al. September 30, 1
1997-09-30
Scanning probe microscope
Grant 5,496,999 - Linker , et al. March 5, 1
1996-03-05
Optical system for scanning microscope
Grant 5,448,399 - Park , et al. September 5, 1
1995-09-05
Piezoresistive cantilever with integral tip for scanning probe microscope
Grant 5,444,244 - Kirk , et al. August 22, 1
1995-08-22
Scanning probe microscope
Grant 5,376,790 - Linker , et al. December 27, 1
1994-12-27
Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask
Grant 5,184,021 - Smith February 2, 1
1993-02-02
Method and apparatus for reading or measuring magneto-optical storage media using pinhole aperture
Grant 4,847,823 - Lindow , et al. July 11, 1
1989-07-11
Method and aparatus for determining surface profiles
Grant 4,748,335 - Lindow , et al. May 31, 1
1988-05-31
Confocal optical imaging system with improved signal-to-noise ratio
Grant RE32,660 - Lindow , et al. May 3, 1
1988-05-03
Method and apparatus for measuring surface profiles
Grant 4,707,610 - Lindow , et al. November 17, 1
1987-11-17
Semiconductor wafer scanning system
Grant 4,689,491 - Lindow , et al. August 25, 1
1987-08-25
Confocal optical imaging system with improved signal-to-noise ratio
Grant 4,634,880 - Lindow , et al. January 6, 1
1987-01-06
Mechanical positioning device for scientific instruments
Grant 4,615,591 - Smith , et al. October 7, 1
1986-10-07
Dark field viewing apparatus
Grant 4,367,648 - Sinclair , et al. January 11, 1
1983-01-11

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