Patent | Date |
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Power assisted automatic supervised classifier creation tool for semiconductor defects Grant 6,999,614 - Bakker , et al. February 14, 2 | 2006-02-14 |
Optical system for scanning microscope App 20010054691 - Park, Sang-Il ;   et al. | 2001-12-27 |
Scanning probe microscope with scan correction Grant 6,265,718 - Park , et al. July 24, 2 | 2001-07-24 |
Scanning probe microscope with multimode head Grant 6,130,427 - Park , et al. October 10, 2 | 2000-10-10 |
Scanning probe microscope with scan correction Grant 6,057,547 - Park , et al. May 2, 2 | 2000-05-02 |
Scanning probe microscope with scan correction Grant 5,939,719 - Park , et al. August 17, 1 | 1999-08-17 |
Scanning probe microscope having a single viewing device for on-axis and oblique optical views Grant 5,877,891 - Park , et al. March 2, 1 | 1999-03-02 |
Scanning probe microscope having a single viewing device for on-axis and oblique angle views Grant 5,714,756 - Park , et al. February 3, 1 | 1998-02-03 |
Large stage system for scanning probe microscopes and other instruments Grant 5,672,816 - Park , et al. September 30, 1 | 1997-09-30 |
Scanning probe microscope Grant 5,496,999 - Linker , et al. March 5, 1 | 1996-03-05 |
Optical system for scanning microscope Grant 5,448,399 - Park , et al. September 5, 1 | 1995-09-05 |
Piezoresistive cantilever with integral tip for scanning probe microscope Grant 5,444,244 - Kirk , et al. August 22, 1 | 1995-08-22 |
Scanning probe microscope Grant 5,376,790 - Linker , et al. December 27, 1 | 1994-12-27 |
Method and apparatus for measuring the dimensions of patterned features on a lithographic photomask Grant 5,184,021 - Smith February 2, 1 | 1993-02-02 |
Method and apparatus for reading or measuring magneto-optical storage media using pinhole aperture Grant 4,847,823 - Lindow , et al. July 11, 1 | 1989-07-11 |
Method and aparatus for determining surface profiles Grant 4,748,335 - Lindow , et al. May 31, 1 | 1988-05-31 |
Confocal optical imaging system with improved signal-to-noise ratio Grant RE32,660 - Lindow , et al. May 3, 1 | 1988-05-03 |
Method and apparatus for measuring surface profiles Grant 4,707,610 - Lindow , et al. November 17, 1 | 1987-11-17 |
Semiconductor wafer scanning system Grant 4,689,491 - Lindow , et al. August 25, 1 | 1987-08-25 |
Confocal optical imaging system with improved signal-to-noise ratio Grant 4,634,880 - Lindow , et al. January 6, 1 | 1987-01-06 |
Mechanical positioning device for scientific instruments Grant 4,615,591 - Smith , et al. October 7, 1 | 1986-10-07 |
Dark field viewing apparatus Grant 4,367,648 - Sinclair , et al. January 11, 1 | 1983-01-11 |