loadpatents
name:-0.0097792148590088
name:-0.0097339153289795
name:-0.00041890144348145
Smedes; Taede Patent Filings

Smedes; Taede

Patent Applications and Registrations

Patent applications and USPTO patent grants for Smedes; Taede.The latest application filed is for "esd-robust stacked driver".

Company Profile
0.9.8
  • Smedes; Taede - Beuningen NL
  • Smedes; Taede - Nijmegen NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Level shifter with ESD protection
Grant 11,251,782 - Grad , et al. February 15, 2
2022-02-15
ESD-robust stacked driver
Grant 10,892,258 - Grad , et al. January 12, 2
2021-01-12
ESD-Robust Stacked Driver
App 20200219867 - Grad; Marcin ;   et al.
2020-07-09
Cross-domain ESD protection
Grant 10,141,301 - Lai , et al. Nov
2018-11-27
Cross-domain Esd Protection
App 20180047720 - LAI; DA-WEI ;   et al.
2018-02-15
I/O device, method for providing ESD protection for an I/O device and ESD protection device for an I/O device
Grant 9,545,041 - Lai , et al. January 10, 2
2017-01-10
Methods and apparatus for ESD structures
Grant 9,443,840 - Hsu , et al. September 13, 2
2016-09-13
I/o Device, Method For Providing Esd Protection For An I/o Device And Esd Protection Device For An I/o Device
App 20150342098 - Lai; Da-Wei ;   et al.
2015-11-26
Methods and Apparatus for ESD Structures
App 20150084154 - Hsu; Yu-Ying ;   et al.
2015-03-26
Methods and apparatus for ESD structures
Grant 8,921,943 - Hsu , et al. December 30, 2
2014-12-30
Methods and Apparatus for ESD Structures
App 20140159206 - Hsu; Yu-Ying ;   et al.
2014-06-12
Secondary ESD circuit
Grant 8,654,488 - Huitsing , et al. February 18, 2
2014-02-18
Secondary ESD Circuit
App 20120008243 - Huitsing; Albert Jan ;   et al.
2012-01-12
Esd Protection
App 20110032648 - Darthenay; Frederic ;   et al.
2011-02-10
Method and apparatus for testing integrated circuits for susceptibility to latch-up
Grant 7,550,990 - Scarpa , et al. June 23, 2
2009-06-23
Method and apparatus for testing integrated circuits for susceptibility to latch-up
App 20070165437 - Scarpa; Andrea ;   et al.
2007-07-19

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