loadpatents
name:-0.00057792663574219
name:-0.014302968978882
name:-0.00093698501586914
Smathers; Daniel Patent Filings

Smathers; Daniel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Smathers; Daniel.The latest application filed is for "system and method for transferring serialized test result data from a system on a chip".

Company Profile
0.14.0
  • Smathers; Daniel - Boulder CO
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System and method for transferring serialized test result data from a system on a chip
Grant 9,739,834 - Azimi , et al. August 22, 2
2017-08-22
Serializer/deserializer and method for transferring data between an integrated circuit and a test interface
Grant 9,285,421 - Azimi , et al. March 15, 2
2016-03-15
System and method for providing a test result from an integrated to an analyzer
Grant 8,977,921 - Azimi , et al. March 10, 2
2015-03-10
System and method for testing an integrated circuit embedded in a system on a chip
Grant 8,713,391 - Azimi , et al. April 29, 2
2014-04-29
Apparatus and method for testing and debugging an integrated circuit
Grant 8,572,448 - Azimi , et al. October 29, 2
2013-10-29
Apparatus and method for testing and debugging an integrated circuit
Grant 8,356,223 - Azimi , et al. January 15, 2
2013-01-15
Apparatus and method for testing and debugging an integrated circuit
Grant 8,161,336 - Azimi , et al. April 17, 2
2012-04-17
Apparatus and method for testing and debugging an integrated circuit
Grant 7,930,604 - Azimi , et al. April 19, 2
2011-04-19
Apparatus and method for testing and debugging an integrated circuit
Grant 7,721,167 - Azimi , et al. May 18, 2
2010-05-18
Apparatus and method for testing and debugging an integrated circuit
Grant 7,590,911 - Azimi , et al. September 15, 2
2009-09-15
Apparatus and method for testing and debugging an integrated circuit
Grant 7,496,812 - Azimi , et al. February 24, 2
2009-02-24
Apparatus and method for testing and debugging an integrated circuit
Grant 7,496,818 - Azimi , et al. February 24, 2
2009-02-24
Apparatus and method for testing and debugging an integrated circuit
Grant 7,444,571 - Azimi , et al. October 28, 2
2008-10-28

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