Sluijterman; Albertus Aemillius Seyno

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sluijterman; Albertus Aemillius Seyno.The latest application filed is for "charged particle microscope, and method for adjusting a charged particle microscope".

Company Profile

1.5.7

Sluijterman; Albertus Aemillius Seyno - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged Particle Microscope, And Method For Adjusting A Charged Particle Microscope App 20200118788 - Sluijterman; Albertus Aemillius Seyno ; et al.	2020-04-16
Method of performing spectroscopy in a transmission charged-particle microscope Grant 9,778,377 - Mele , et al. October 3, 2	2017-10-03
Method Of Performing Spectroscopy In A Transmission Charged-particle Microscope App 20160276130 - Mele; Luigi ; et al.	2016-09-22
Charged-particle microscopy with enhanced electron detection Grant 9,208,993 - Sluijterman , et al. December 8, 2	2015-12-08
Imaging a Sample with Multiple Beams and Multiple Detectors App 20150279615 - Potocek; Pavel ; et al.	2015-10-01
Charged-particle Microscopy With Enhanced Electron Detection App 20150155131 - Sluijterman; Albertus Aemillius Seyno ; et al.	2015-06-04
Charged particle detector system comprising a conversion electrode Grant 8,952,328 - Sluijterman , et al. February 10, 2	2015-02-10
Charged Particle Detector System Comprising a Conversion Electrode App 20130056634 - Sluijterman; Albertus Aemillius Seyno ; et al.	2013-03-07
Dark field detector for use in an electron microscope Grant 8,288,724 - Kooijman , et al. October 16, 2	2012-10-16
Dark Field Detector For Use In An Electron Microscope App 20100258721 - KOOIJMAN; CORNELIS SANDER ; et al.	2010-10-14

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